National Semiconductor Metrology Program

Author : National Institute of Standards and Technology (U.S.)
Publisher :
ISBN 13 :
Total Pages : 252 pages
Book Rating : 4.60/5 ( download)

DOWNLOAD NOW!

Download or read book National Semiconductor Metrology Program written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1990 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author : National Semiconductor Metrology Program (U.S.)
Publisher :
ISBN 13 :
Total Pages : 160 pages
Book Rating : 4.42/5 ( download)

DOWNLOAD NOW!

Download or read book National Semiconductor Metrology Program written by National Semiconductor Metrology Program (U.S.) and published by . This book was released on 2000 with total page 160 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author : National Institute of Standards and Technology (U.S.)
Publisher :
ISBN 13 :
Total Pages : 160 pages
Book Rating : 4.75/5 ( download)

DOWNLOAD NOW!

Download or read book National Semiconductor Metrology Program written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 2000 with total page 160 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author : National Semiconductor Metrology Program (U.S.)
Publisher :
ISBN 13 :
Total Pages : 136 pages
Book Rating : 4.36/5 ( download)

DOWNLOAD NOW!

Download or read book National Semiconductor Metrology Program written by National Semiconductor Metrology Program (U.S.) and published by . This book was released on with total page 136 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author :
Publisher :
ISBN 13 :
Total Pages : 160 pages
Book Rating : 4.42/5 ( download)

DOWNLOAD NOW!

Download or read book National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000 written by and published by . This book was released on 2000 with total page 160 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author :
Publisher :
ISBN 13 :
Total Pages : 148 pages
Book Rating : 4.53/5 ( download)

DOWNLOAD NOW!

Download or read book National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999 written by and published by . This book was released on 1999 with total page 148 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author :
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.18/5 ( download)

DOWNLOAD NOW!

Download or read book Monthly Catalog of United States Government Publications written by and published by . This book was released on 2004 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author :
Publisher :
ISBN 13 :
Total Pages : 2012 pages
Book Rating : 4.11/5 ( download)

DOWNLOAD NOW!

Download or read book New Serial Titles written by and published by . This book was released on 1995 with total page 2012 pages. Available in PDF, EPUB and Kindle. Book excerpt: A union list of serials commencing publication after Dec. 31, 1949.

Author : David G. Seiler
Publisher : American Institute of Physics
ISBN 13 :
Total Pages : 868 pages
Book Rating : 4.36/5 ( download)

DOWNLOAD NOW!

Download or read book Characterization and Metrology for ULSI Technology: 2003 written by David G. Seiler and published by American Institute of Physics. This book was released on 2003-10-08 with total page 868 pages. Available in PDF, EPUB and Kindle. Book excerpt: The worldwide semiconductor community faces increasingly difficult challenges as it moves into the manufacturing of chips with feature sizes approaching 100 nm and beyond. The magnitude of these challenges demands special attention from the metrology and analytical measurements community. New paradigms must be found. Adequate research and development for new metrology concepts are urgently needed. Topics include: integrated circuit history, challenges and overviews, front end, lithography, interconnect and back end, and critical analytical techniques. Characterization and metrology are key enablers for developing new semiconductor technology and in improving manufacturing. This book summarizes major issues and gives critical reviews of important measurement techniques that are crucial to continue the advances in semiconductor technology. It covers major aspects of process technology and most characterization techniques for silicon research, including development, manufacturing, and diagnostics. The editors believe that this book of collected papers provides a concise and effective portrayal of industry characterization needs and the way they are being addressed by industry, academia, and government to continue the dramatic progress in semiconductor technology. Hopefully, it will also provide a basis for stimulating advances in metrology and new ideas for research and development.

Author : National Research Council (U.S.). Board on Assessment of NIST Programs
Publisher : National Academies
ISBN 13 :
Total Pages : 234 pages
Book Rating : 4.94/5 ( download)

DOWNLOAD NOW!

Download or read book An Assessment of the National Institute of Standards and Technology Programs written by National Research Council (U.S.). Board on Assessment of NIST Programs and published by National Academies. This book was released on 1997 with total page 234 pages. Available in PDF, EPUB and Kindle. Book excerpt: