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Author : Thomas W. Staley
Publisher :
ISBN 13 :
Total Pages : 444 pages
Book Rating : 4.20/5 ( download)
Download or read book Statistical Optimization and Analysis of X-ray Rocking Curves written by Thomas W. Staley and published by . This book was released on 1997 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : A.G Cullis
Publisher : CRC Press
ISBN 13 : 9780750309790
Total Pages : 712 pages
Book Rating : 4.92/5 ( download)
Download or read book Microscopy of Semiconducting Materials 2003 written by A.G Cullis and published by CRC Press. This book was released on 2004-04-20 with total page 712 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronic devices rely on ever-greater miniaturization of components, and semiconductor processing is approaching the domain of nanotechnology. Studies of devices in this regime can only be carried out with the most advanced forms of microscopy. Accordingly, Microscopy of Semiconducting Materials focuses on international developments in semiconductor studies carried out by all forms of microscopy. It provides an overview of the latest instrumentation, analysis techniques, and state-of-the-art advances in semiconducting materials science for solid state physicists, chemists, and material scientists.
Author : United States. National Bureau of Standards
Publisher :
ISBN 13 :
Total Pages : 826 pages
Book Rating : 4.24/5 ( download)
Download or read book Journal of Research of the National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1968 with total page 826 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Yves Epelboin
Publisher : Springer Science & Business Media
ISBN 13 : 9401736995
Total Pages : 317 pages
Book Rating : 4.92/5 ( download)
Download or read book World Directory of Crystallographers written by Yves Epelboin and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 317 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 9th edition of the World Directory of Crystallographers and of Other Scientists Employing Crystallographic Methods, which contains 7907 entries embracing 72 countries, differs considerably from the 8th edition, published in 1990. The content has been updated, and the methods used to acquire the information presented and to produce this new edition of the Directory have involved the latest advances in technology. The Directory is now also available as a regularly updated electronic database, accessible via e-mail, Telnet, Gopher, World-Wide Web, and Mosaic. Full details are given in an Appendix to the printed edition.
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ISBN 13 :
Total Pages : 1572 pages
Book Rating : 4.13/5 ( download)
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1992 with total page 1572 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 1058 pages
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Download or read book Physics Briefs written by and published by . This book was released on 1993 with total page 1058 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 872 pages
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Download or read book American Doctoral Dissertations written by and published by . This book was released on 1996 with total page 872 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : George E. Totten
Publisher : CRC Press
ISBN 13 : 1351045628
Total Pages : 2957 pages
Book Rating : 4.29/5 ( download)
Download or read book Encyclopedia of Aluminum and Its Alloys, Two-Volume Set (Print) written by George E. Totten and published by CRC Press. This book was released on 2018-12-07 with total page 2957 pages. Available in PDF, EPUB and Kindle. Book excerpt: This encyclopedia, written by authoritative experts under the guidance of an international panel of key researchers from academia, national laboratories, and industry, is a comprehensive reference covering all major aspects of metallurgical science and engineering of aluminum and its alloys. Topics covered include extractive metallurgy, powder metallurgy (including processing), physical metallurgy, production engineering, corrosion engineering, thermal processing (processes such as metalworking and welding, heat treatment, rolling, casting, hot and cold forming), surface engineering and structure such as crystallography and metallography.
Author : René Guinebretière
Publisher : John Wiley & Sons
ISBN 13 : 1118613953
Total Pages : 290 pages
Book Rating : 4.55/5 ( download)
Download or read book X-Ray Diffraction by Polycrystalline Materials written by René Guinebretière and published by John Wiley & Sons. This book was released on 2013-03-01 with total page 290 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.
Author : Martin Schmidbauer
Publisher : Springer Science & Business Media
ISBN 13 : 9783540201793
Total Pages : 224 pages
Book Rating : 4.93/5 ( download)
Download or read book X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures written by Martin Schmidbauer and published by Springer Science & Business Media. This book was released on 2004-01-09 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.
