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Author : Willem Dirk van Driel
Publisher : Springer Nature
ISBN 13 : 3031593618
Total Pages : 405 pages
Book Rating : 4.11/5 ( download)
Download or read book Recent Advances in Microelectronics Reliability written by Willem Dirk van Driel and published by Springer Nature. This book was released on with total page 405 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Willem Dirk van Driel
Publisher : Springer
ISBN 13 : 9783031593604
Total Pages : 0 pages
Book Rating : 4.0X/5 ( download)
Download or read book Recent Advances in Microelectronics Reliability written by Willem Dirk van Driel and published by Springer. This book was released on 2024-07-21 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes the latest progress in reliability analysis of microelectronic products. The content grows out of an EU project, named Intelligent Reliability 4.0 - iRel40 (see www.irel40.eu ). Different industrial sectors and topics are covered, such as electronics in automotive, rail transport, lighting and personal appliances. Several case studies and examples are discussed, which will enable readers to assess and mitigate similar failure cases. More importantly, this book tries to present methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of electronic devices.
Author : Soumia El Hani
Publisher : Springer
ISBN 13 : 3030052761
Total Pages : 208 pages
Book Rating : 4.68/5 ( download)
Download or read book Recent Advances in Electrical and Information Technologies for Sustainable Development written by Soumia El Hani and published by Springer. This book was released on 2019-02-08 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book includes the best extended papers which were selected from the 3rd International Conference of Electrical and Information Technologies (ICEIT 2017, Morocco). The book spans two inter-related research domains which shaped modern societies, solved many of their development problems, and contributed to their unprecedented economic growth and social welfare. Selected papers are based on original and high quality research. They were peer reviewed by experts in the field. They are grouped into five parts. Part I deals with Power System and Electronics topics that include Power Electronics & Energy Conversion, Actuators & Micro/Nanotechnology, etc. Part II relates to Control Systems and their applications. Part III concerns the topic of Information Technology that basically includes Smart Grid, Information Security, Cloud Computing Distributed, Big Data, etc. Part IV discusses Telecommunications and Vehicular Technologies topics that include, Green Networking and Communications, Wireless Ad-hoc and Sensor Networks, etc. Part V covers Green Applications and Interdisciplinary topics, that include intelligent and Green Technologies for Transportation Systems, Smart Cities, etc. This book offers a good opportunity for young researchers, novice scholars and whole academic sphere to explore new trends in Electrical and information Technologies.
Author : Joseph B. Bernstein
Publisher : John Wiley & Sons
ISBN 13 : 1394210930
Total Pages : 404 pages
Book Rating : 4.30/5 ( download)
Download or read book Reliability Prediction for Microelectronics written by Joseph B. Bernstein and published by John Wiley & Sons. This book was released on 2024-02-20 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt: RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the ‘physics of failure’, combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditions Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.
Author : Ninoslav D. Stojadinović
Publisher :
ISBN 13 :
Total Pages : 120 pages
Book Rating : 4.21/5 ( download)
Download or read book Advances in Microelectronics: Approaches in the Millenium written by Ninoslav D. Stojadinović and published by . This book was released on 1997 with total page 120 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Rajesh Gomatam
Publisher : BRILL
ISBN 13 : 9004165924
Total Pages : 434 pages
Book Rating : 4.22/5 ( download)
Download or read book Electrically Conductive Adhesives written by Rajesh Gomatam and published by BRILL. This book was released on 2008-12-23 with total page 434 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is based on two Special Issues of the Journal of Adhesion Science and Technology (JAST vol. 22, no. 8-9 and vol. 22, no. 14) dedicated to the logic of electrically conductive adhesives. The contains a total of 21 papers (reflecting overviews and original research).
Author : Esteban Tlelo-Cuautle
Publisher : BoD – Books on Demand
ISBN 13 : 9533073233
Total Pages : 384 pages
Book Rating : 4.31/5 ( download)
Download or read book Advances in Analog Circuits written by Esteban Tlelo-Cuautle and published by BoD – Books on Demand. This book was released on 2011-02-02 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights key design issues and challenges to guarantee the development of successful applications of analog circuits. Researchers around the world share acquired experience and insights to develop advances in analog circuit design, modeling and simulation. The key contributions of the sixteen chapters focus on recent advances in analog circuits to accomplish academic or industrial target specifications.
Author : Pradeep Lall
Publisher : CRC Press
ISBN 13 : 0429605595
Total Pages : 332 pages
Book Rating : 4.98/5 ( download)
Download or read book Influence of Temperature on Microelectronics and System Reliability written by Pradeep Lall and published by CRC Press. This book was released on 2020-07-09 with total page 332 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures. The author provides readers a sound scientific basis for system operation at realistic steady state temperatures without reliability penalties. Higher temperature performance than is commonly recommended is shown to be cost effective in production for life cycle costs. The microelectronic package considered in the book is assumed to consist of a semiconductor device with first-level interconnects that may be wirebonds, flip-chip, or tape automated bonds; die attach; substrate; substrate attach; case; lid; lid seal; and lead seal. The temperature effects on electrical parameters of both bipolar and MOSFET devices are discussed, and models quantifying the temperature effects on package elements are identified. Temperature-related models have been used to derive derating criteria for determining the maximum and minimum allowable temperature stresses for a given microelectronic package architecture. The first chapter outlines problems with some of the current modeling strategies. The next two chapters present microelectronic device failure mechanisms in terms of their dependence on steady state temperature, temperature cycle, temperature gradient, and rate of change of temperature at the chip and package level. Physics-of-failure based models used to characterize these failure mechanisms are identified and the variabilities in temperature dependence of each of the failure mechanisms are characterized. Chapters 4 and 5 describe the effects of temperature on the performance characteristics of MOS and bipolar devices. Chapter 6 discusses using high-temperature stress screens, including burn-in, for high-reliability applications. The burn-in conditions used by some manufacturers are examined and a physics-of-failure approach is described. The
Author : Way Kuo
Publisher : Springer Science & Business Media
ISBN 13 : 1461556716
Total Pages : 407 pages
Book Rating : 4.18/5 ( download)
Download or read book Reliability, Yield, and Stress Burn-In written by Way Kuo and published by Springer Science & Business Media. This book was released on 2013-11-27 with total page 407 pages. Available in PDF, EPUB and Kindle. Book excerpt: The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: • the economic impact of employing the microelectronics fabricated by in dustry, • a study of the relationship between reliability and yield, • the progression toward miniaturization and higher reliability, and • the correctness and complexity of new system designs, which include a very significant portion of software.
Author : Evangelos Triantaphyllou
Publisher : World Scientific
ISBN 13 : 9814472174
Total Pages : 816 pages
Book Rating : 4.73/5 ( download)
Download or read book Recent Advances In Data Mining Of Enterprise Data: Algorithms And Applications written by Evangelos Triantaphyllou and published by World Scientific. This book was released on 2008-01-15 with total page 816 pages. Available in PDF, EPUB and Kindle. Book excerpt: The main goal of the new field of data mining is the analysis of large and complex datasets. Some very important datasets may be derived from business and industrial activities. This kind of data is known as “enterprise data”. The common characteristic of such datasets is that the analyst wishes to analyze them for the purpose of designing a more cost-effective strategy for optimizing some type of performance measure, such as reducing production time, improving quality, eliminating wastes, or maximizing profit. Data in this category may describe different scheduling scenarios in a manufacturing environment, quality control of some process, fault diagnosis in the operation of a machine or process, risk analysis when issuing credit to applicants, management of supply chains in a manufacturing system, or data for business related decision-making.
