Papers From The 12th International Conference On Noncontact Atomic Force Microscopy Nc Afm 2009 And Casimir 2009 Satellite Workshop

Author :
Publisher :
ISBN 13 : 9780982301258
Total Pages : pages
Book Rating : 4.51/5 ( download)

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Download or read book Papers from the 12th International Conference on Noncontact Atomic Force Microscopy (NC-AFM 2009) and Casimir 2009 Satellite Workshop written by and published by . This book was released on 2010 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author : Seizo Morita
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.28/5 ( download)

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Download or read book Noncontact Atomic Force Microscopy written by Seizo Morita and published by . This book was released on 1999 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author : Samuel H. Cohen
Publisher : Springer Science & Business Media
ISBN 13 : 1475793251
Total Pages : 243 pages
Book Rating : 4.53/5 ( download)

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Download or read book Atomic Force Microscopy/Scanning Tunneling Microscopy 2 written by Samuel H. Cohen and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 243 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art AFM/STM microscopes, other probe microscopes, imaging hardware and software, as well as the latest microscope-related and sample preparation accessories. These were all very favorably received by the meeting's attendees. Following opening remarks by Natick's Commander, Colonel Morris E. Price, Jr., and the Technical Director, Dr. Robert W. Lewis, the symposium began with the Keynote Address given by Dr. Michael F. Crommie from Boston University. The agenda was divided into four major sessions. The papers (and posters) presented at the symposium represented a broad spectrum of topics in atomic force microscopy, scanning tunneling microscopy, and other probe microscopies.

Author : M.T. Bray
Publisher : Springer Science & Business Media
ISBN 13 : 1475793227
Total Pages : 431 pages
Book Rating : 4.22/5 ( download)

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Download or read book Atomic Force Microscopy/Scanning Tunneling Microscopy written by M.T. Bray and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 431 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1993 in Natick, Massachusetts. This book represents the compilation of the papers presented at the meeting. The purpose ofthis symposium was to provide a forum where scientists from a number of diverse fields could interact with one another and exchange ideas. The various topics inc1uded application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments inc1uding new probe microscopies and frontiers in this exciting area. The meeting's format was designed to encourage communication between members of the general scientific community and those individuals who are at the cutting edge of AFM, STM and other probe microscopies. It immediately became clear that this conference enabled interdisciplinary interactions among researchers from academia, industry and government, and set the tone for future collaborations. Expert scientists from diverse scientific areas including physics, chemistry, biology, materials science and electronics were invited to participate in the symposium. The agenda of the meeting was divided into three major sessions. In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.

Author : Samuel H. Cohen
Publisher : Springer Science & Business Media
ISBN 13 : 0306462974
Total Pages : 208 pages
Book Rating : 4.79/5 ( download)

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Download or read book Atomic Force Microscopy/Scanning Tunneling Microscopy 3 written by Samuel H. Cohen and published by Springer Science & Business Media. This book was released on 1999-12-31 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt: This proceedings is based on the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium. The purpose of the meeting was to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies. The papers have been written by experts in probe microscopy from around the world, representing a wide range of disciplines, including physics, biotechnology, nanotechnology, chemistry, and materials science.

Author : Tomasz Tański
Publisher : BoD – Books on Demand
ISBN 13 : 1789851696
Total Pages : 116 pages
Book Rating : 4.94/5 ( download)

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Download or read book Atomic-force Microscopy and Its Applications written by Tomasz Tański and published by BoD – Books on Demand. This book was released on 2019-01-30 with total page 116 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as specialists. This book aims to provide the reader with a comprehensive overview of the new trends, research results and development of atomic force microscopy. The chapters for this book have been written by respected and well-known researchers and specialists from different countries. We hope that after studying this book, you will have objective knowledge about the possible uses of atomic force microscopy in many scientific aspects of our civilisation.

Author : Michael T. Postek
Publisher : Society of Photo Optical
ISBN 13 : 9780819476548
Total Pages : 438 pages
Book Rating : 4.44/5 ( download)

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Download or read book Scanning Microscopy 2009 written by Michael T. Postek and published by Society of Photo Optical. This book was released on 2009 with total page 438 pages. Available in PDF, EPUB and Kindle. Book excerpt: Includes Proceedings Vol. 7821

Author : Victor Bellitto
Publisher : BoD – Books on Demand
ISBN 13 : 9535104144
Total Pages : 272 pages
Book Rating : 4.48/5 ( download)

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Download or read book Atomic Force Microscopy written by Victor Bellitto and published by BoD – Books on Demand. This book was released on 2012-03-23 with total page 272 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.

Author : Armand Vance
Publisher :
ISBN 13 : 9781681172125
Total Pages : 0 pages
Book Rating : 4.27/5 ( download)

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Download or read book Atomic Force Microscopy written by Armand Vance and published by . This book was released on 2016-04 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The atomic force microscope (AFM) is one kind of scanning probe microscopes (SPM). SPMs are designed to measure local properties, such as height, friction, magnetism, with a probe. To acquire an image, the SPM raster-scans the probe over a small area of the sample, measuring the local property simultaneously. The information is gathered by "feeling" or "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable very precise scanning. Compared to competitive technologies such as optical microscopy and electron microscopy, the major difference between these and the atomic-force microscope is that the latter does not use lenses or beam irradiation. Therefore, it does not suffer from a limitation of space resolution due to diffraction limit and aberration, and it is not necessary to prepare a space for guiding the beam (by creating a vacuum) or to stain the sample. Piezo-ceramics position the tip with high resolution. Piezoelectric ceramics are a class of materials that expand or contract when in the presence of a voltage gradient. Piezo-ceramics make it possible to create three-dimensional positioning devices of arbitrarily high precision. In contact mode, AFMs use feedback to regulate the force on the sample. The AFM not only measures the force on the sample but also regulates it, allowing acquisition of images at very low forces. The feedback loop consists of the tube scanner that controls the height of the tip; the cantilever and optical lever, which measures the local height of the sample; and a feedback circuit that attempts to keep the cantilever deflection constant by adjusting the voltage applied to the scanner. The atomic force microscope is a powerful tool that is invaluable if to measure incredibly small samples with a great degree of accuracy. Unlike rival technologies it does not require either a vacuum or the sample to undergo treatment that might damage it. At the limits of operation however, researchers have demonstrated atomic resolution in high vacuum and even liquid environments. The book entitled Atomic Force Microscopy covers the applications and theories of atomic force microscope.

Author : Ronald G. Reifenberger
Publisher : World Scientific Publishing Company Incorporated
ISBN 13 : 9789814630344
Total Pages : 350 pages
Book Rating : 4.49/5 ( download)

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Download or read book Fundamentals of Atomic Force Microscopy written by Ronald G. Reifenberger and published by World Scientific Publishing Company Incorporated. This book was released on 2015-02 with total page 350 pages. Available in PDF, EPUB and Kindle. Book excerpt: The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM.