Atomic Force Microscopy Scanning Nearfield Optical Microscopy And Nanoscratching

Author : Gerd Kaupp
Publisher : Springer Science & Business Media
ISBN 13 : 3540284729
Total Pages : 302 pages
Book Rating : 4.27/5 ( download)

DOWNLOAD NOW!

Download or read book Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching written by Gerd Kaupp and published by Springer Science & Business Media. This book was released on 2006-10-24 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.

Author : Victor J Morris
Publisher : World Scientific
ISBN 13 : 190897821X
Total Pages : 423 pages
Book Rating : 4.19/5 ( download)

DOWNLOAD NOW!

Download or read book Atomic Force Microscopy For Biologists (2nd Edition) written by Victor J Morris and published by World Scientific. This book was released on 2009-08-11 with total page 423 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopy (AFM) is part of a range of emerging microscopic methods for biologists which offer the magnification range of both the light and electron microscope, but allow imaging under the 'natural' conditions usually associated with the light microscope. To biologists, AFM offers the prospect of high resolution images of biological material, images of molecules and their interactions even under physiological conditions, and the study of molecular processes in living systems. This book provides a realistic appreciation of the advantages and limitations of the technique and the present and future potential for improving the understanding of biological systems.The second edition of this bestseller has been updated to describe the latest developments in this exciting field, including a brand new chapter on force spectroscopy. The dramatic developments of AFM over the past ten years from a simple imaging tool to the multi-faceted, nano-manipulating technique that it is today are conveyed in a lively and informative narrative, which provides essential reading for students and experienced researchers alike./a

Author :
Publisher :
ISBN 13 : 9781523117499
Total Pages : 361 pages
Book Rating : 4.94/5 ( download)

DOWNLOAD NOW!

Download or read book Nano-optics and Near-field Optical Microscopy written by and published by . This book was released on 2009 with total page 361 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This groundbreaking book focuses on near-field microscopy which has opened up optical processes at the nanoscale for direct inspection. Further, it explores the emerging area of nano-optics which promises to make possible optical microscopy with true nanometer resolution. This frontline resource helps you achieve high resolution optical imaging of biological species and functional materials. You also find guidance in the imaging of optical device operation and new nanophotonics functionalities"--EBL.

Author : Maria Vittoria Russo
Publisher : Springer Science & Business Media
ISBN 13 : 9048131928
Total Pages : 288 pages
Book Rating : 4.21/5 ( download)

DOWNLOAD NOW!

Download or read book Advances in Macromolecules written by Maria Vittoria Russo and published by Springer Science & Business Media. This book was released on 2010-03-10 with total page 288 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Polymeric and Nanostructured Macromolecules" presents the recent advances made in the synthesis, characterization, and applications of polymeric macromolecules. This book provides an excellent overview of the recent breakthroughs in the science of macromolecules, with an emphasis on nanostructured macromolecules and the perspectives that these versatile materials offer to different fields such as optoelectronics and biotechnology. Advanced undergraduate, graduate students and researchers alike will find the topics concerning physical and chemical properties of advanced macromolecular materials of great interest.

Author : Samuel H. Cohen
Publisher : Springer Science & Business Media
ISBN 13 : 1475793251
Total Pages : 243 pages
Book Rating : 4.53/5 ( download)

DOWNLOAD NOW!

Download or read book Atomic Force Microscopy/Scanning Tunneling Microscopy 2 written by Samuel H. Cohen and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 243 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art AFM/STM microscopes, other probe microscopes, imaging hardware and software, as well as the latest microscope-related and sample preparation accessories. These were all very favorably received by the meeting's attendees. Following opening remarks by Natick's Commander, Colonel Morris E. Price, Jr., and the Technical Director, Dr. Robert W. Lewis, the symposium began with the Keynote Address given by Dr. Michael F. Crommie from Boston University. The agenda was divided into four major sessions. The papers (and posters) presented at the symposium represented a broad spectrum of topics in atomic force microscopy, scanning tunneling microscopy, and other probe microscopies.

Author : Bharat Bhushan
Publisher : Springer Science & Business Media
ISBN 13 : 3540850376
Total Pages : 281 pages
Book Rating : 4.73/5 ( download)

DOWNLOAD NOW!

Download or read book Applied Scanning Probe Methods XI written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2008-10-22 with total page 281 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.

Author : Bharat Bhushan
Publisher : Springer Science & Business Media
ISBN 13 : 3540850392
Total Pages : 271 pages
Book Rating : 4.97/5 ( download)

DOWNLOAD NOW!

Download or read book Applied Scanning Probe Methods XII written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2008-10-24 with total page 271 pages. Available in PDF, EPUB and Kindle. Book excerpt: Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface deformation processes during straining of a specimen. First steps towards this goal were shown in the 1990s in [1–4] but none of these approaches truly was a microtensile test with sample thicknesses in the range of micrometers. To the authors’ knowledge, this was shown for the rst time by Hild et al. in [5]. 16.

Author : Bharat Bhushan
Publisher : Springer Science & Business Media
ISBN 13 : 354085049X
Total Pages : 284 pages
Book Rating : 4.96/5 ( download)

DOWNLOAD NOW!

Download or read book Applied Scanning Probe Methods XIII written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2008-10-29 with total page 284 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Author : Bharat Bhushan
Publisher : Springer Science & Business Media
ISBN 13 : 3540740805
Total Pages : 465 pages
Book Rating : 4.03/5 ( download)

DOWNLOAD NOW!

Download or read book Applied Scanning Probe Methods VIII written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2007-12-20 with total page 465 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

Author : Bharat Bhushan
Publisher : Springer Science & Business Media
ISBN 13 : 3540740856
Total Pages : 475 pages
Book Rating : 4.58/5 ( download)

DOWNLOAD NOW!

Download or read book Applied Scanning Probe Methods X written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2007-12-20 with total page 475 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.