Vlsi Design For Manufacturing Yield Enhancement

Author : Stephen W. Director
Publisher : Springer Science & Business Media
ISBN 13 : 1461315212
Total Pages : 299 pages
Book Rating : 4.16/5 ( download)

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Download or read book VLSI Design for Manufacturing: Yield Enhancement written by Stephen W. Director and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 299 pages. Available in PDF, EPUB and Kindle. Book excerpt: One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as "design for manufacture" or "statistical design". As device sizes continue to shrink, the effects of the inherent fluctuations in the IC fabrication process will have an even more obvious effect on circuit performance. And design for manufacture will increase in importance. We have been working in the area of statistically based computer aided design for more than 13 years. During the last decade we have been working with each other, and individually with our students, to develop methods and CAD tools that can be used to improve yield during the design and manufacturing phases of IC realization. This effort has resulted in a large number of publications that have appeared in a variety of journals and conference proceedings. Thus our motivation in writing this book is to put, in one place, a description of our approach to IC yield enhancement. While the work that is contained in this book has appeared in the open literature, we have attempted to use a consistent notation throughout this book.

Author : Charles Chiang
Publisher : Springer Science & Business Media
ISBN 13 : 1402051883
Total Pages : 277 pages
Book Rating : 4.83/5 ( download)

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Download or read book Design for Manufacturability and Yield for Nano-Scale CMOS written by Charles Chiang and published by Springer Science & Business Media. This book was released on 2007-06-15 with total page 277 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.

Author : Michael Orshansky
Publisher : Springer Science & Business Media
ISBN 13 : 0387690115
Total Pages : 319 pages
Book Rating : 4.17/5 ( download)

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Download or read book Design for Manufacturability and Statistical Design written by Michael Orshansky and published by Springer Science & Business Media. This book was released on 2007-10-28 with total page 319 pages. Available in PDF, EPUB and Kindle. Book excerpt: Design for Manufacturability and Statistical Design: A Comprehensive Approach presents a comprehensive overview of methods that need to be mastered in understanding state-of-the-art design for manufacturability and statistical design methodologies. Broadly, design for manufacturability is a set of techniques that attempt to fix the systematic sources of variability, such as those due to photolithography and CMP. Statistical design, on the other hand, deals with the random sources of variability. Both paradigms operate within a common framework, and their joint comprehensive treatment is one of the objectives of this book and an important differentation.

Author : Ibrahim (Abe) M. Elfadel
Publisher : Springer
ISBN 13 : 3030046664
Total Pages : 694 pages
Book Rating : 4.68/5 ( download)

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Download or read book Machine Learning in VLSI Computer-Aided Design written by Ibrahim (Abe) M. Elfadel and published by Springer. This book was released on 2019-03-15 with total page 694 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides readers with an up-to-date account of the use of machine learning frameworks, methodologies, algorithms and techniques in the context of computer-aided design (CAD) for very-large-scale integrated circuits (VLSI). Coverage includes the various machine learning methods used in lithography, physical design, yield prediction, post-silicon performance analysis, reliability and failure analysis, power and thermal analysis, analog design, logic synthesis, verification, and neuromorphic design. Provides up-to-date information on machine learning in VLSI CAD for device modeling, layout verifications, yield prediction, post-silicon validation, and reliability; Discusses the use of machine learning techniques in the context of analog and digital synthesis; Demonstrates how to formulate VLSI CAD objectives as machine learning problems and provides a comprehensive treatment of their efficient solutions; Discusses the tradeoff between the cost of collecting data and prediction accuracy and provides a methodology for using prior data to reduce cost of data collection in the design, testing and validation of both analog and digital VLSI designs. From the Foreword As the semiconductor industry embraces the rising swell of cognitive systems and edge intelligence, this book could serve as a harbinger and example of the osmosis that will exist between our cognitive structures and methods, on the one hand, and the hardware architectures and technologies that will support them, on the other....As we transition from the computing era to the cognitive one, it behooves us to remember the success story of VLSI CAD and to earnestly seek the help of the invisible hand so that our future cognitive systems are used to design more powerful cognitive systems. This book is very much aligned with this on-going transition from computing to cognition, and it is with deep pleasure that I recommend it to all those who are actively engaged in this exciting transformation. Dr. Ruchir Puri, IBM Fellow, IBM Watson CTO & Chief Architect, IBM T. J. Watson Research Center

Author : Wai-Kai Chen
Publisher : CRC Press
ISBN 13 : 142005919X
Total Pages : 435 pages
Book Rating : 4.99/5 ( download)

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Download or read book Computer Aided Design and Design Automation written by Wai-Kai Chen and published by CRC Press. This book was released on 2018-03-12 with total page 435 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume of The Circuits and Filters Handbook, Third Edition focuses on computer aided design and design automation. In the first part of the book, international contributors address topics such as the modeling of circuit performances, symbolic analysis methods, numerical analysis methods, design by optimization, statistical design optimization, and physical design automation. In the second half of the text, they turn their attention to RF CAD, high performance simulation, formal verification, RTK behavioral synthesis, system-level design, an Internet-based micro-electronic design automation framework, performance modeling, and embedded computing systems design.

Author : Wai-Kai Chen
Publisher : CRC Press
ISBN 13 : 1000006573
Total Pages : 3364 pages
Book Rating : 4.75/5 ( download)

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Download or read book The Circuits and Filters Handbook (Five Volume Slipcase Set) written by Wai-Kai Chen and published by CRC Press. This book was released on 2018-12-14 with total page 3364 pages. Available in PDF, EPUB and Kindle. Book excerpt: Standard-setting, groundbreaking, authoritative, comprehensive—these often overused words perfectly describe The Circuits and Filters Handbook, Third Edition. This standard-setting resource has documented the momentous changes that have occurred in the field of electrical engineering, providing the most comprehensive coverage available. More than 150 contributing experts offer in-depth insights and enlightened perspectives into standard practices and effective techniques that will make this set the first—and most likely the only—tool you select to help you with problem solving. In its third edition, this groundbreaking bestseller surveys accomplishments in the field, providing researchers and designers with the comprehensive detail they need to optimize research and design. All five volumes include valuable information on the emerging fields of circuits and filters, both analog and digital. Coverage includes key mathematical formulas, concepts, definitions, and derivatives that must be mastered to perform cutting-edge research and design. The handbook avoids extensively detailed theory and instead concentrates on professional applications, with numerous examples provided throughout. The set includes more than 2500 illustrations and hundreds of references. Available as a comprehensive five-volume set, each of the subject-specific volumes can also be purchased separately.

Author : José Pineda de Gyvez
Publisher : John Wiley & Sons
ISBN 13 : 0780334477
Total Pages : 338 pages
Book Rating : 4.72/5 ( download)

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Download or read book Integrated Circuit Manufacturability written by José Pineda de Gyvez and published by John Wiley & Sons. This book was released on 1998-10-30 with total page 338 pages. Available in PDF, EPUB and Kindle. Book excerpt: "INTEGRATED CIRCUIT MANUFACTURABILITY provides comprehensive coverage of the process and design variables that determine the ease and feasibility of fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design to system architecture. The material provides a theoretical background as well as case studies, examining the entire design for the manufacturing path from circuit to silicon. Each chapter includes tutorial and practical applications coverage. INTEGRATED CIRCUIT MANUFACTURABILITY illustrates the implications of manufacturability at every level of abstraction, including the effects of defects on the layout, their mapping to electrical faults, and the corresponding approaches to detect such faults. The reader will be introduced to key practical issues normally applied in industry and usually required by quality, product, and design engineering departments in today's design practices: * Yield management strategies * Effects of spot defects * Inductive fault analysis and testing * Fault-tolerant architectures and MCM testing strategies. This book will serve design and product engineers both from academia and industry. It can also be used as a reference or textbook for introductory graduate-level courses on manufacturing."

Author : Wai-Kai Chen
Publisher : CRC Press
ISBN 13 : 9781420041408
Total Pages : 3076 pages
Book Rating : 4.01/5 ( download)

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Download or read book The Circuits and Filters Handbook written by Wai-Kai Chen and published by CRC Press. This book was released on 2002-12-23 with total page 3076 pages. Available in PDF, EPUB and Kindle. Book excerpt: A bestseller in its first edition, The Circuits and Filters Handbook has been thoroughly updated to provide the most current, most comprehensive information available in both the classical and emerging fields of circuits and filters, both analog and digital. This edition contains 29 new chapters, with significant additions in the areas of computer-

Author : Ulrich Ramacher
Publisher : Springer Science & Business Media
ISBN 13 : 1461539943
Total Pages : 346 pages
Book Rating : 4.40/5 ( download)

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Download or read book VLSI Design of Neural Networks written by Ulrich Ramacher and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 346 pages. Available in PDF, EPUB and Kindle. Book excerpt: The early era of neural network hardware design (starting at 1985) was mainly technology driven. Designers used almost exclusively analog signal processing concepts for the recall mode. Learning was deemed not to cause a problem because the number of implementable synapses was still so low that the determination of weights and thresholds could be left to conventional computers. Instead, designers tried to directly map neural parallelity into hardware. The architectural concepts were accordingly simple and produced the so called interconnection problem which, in turn, made many engineers believe it could be solved by optical implementation in adequate fashion only. Furthermore, the inherent fault-tolerance and limited computation accuracy of neural networks were claimed to justify that little effort is to be spend on careful design, but most effort be put on technology issues. As a result, it was almost impossible to predict whether an electronic neural network would function in the way it was simulated to do. This limited the use of the first neuro-chips for further experimentation, not to mention that real-world applications called for much more synapses than could be implemented on a single chip at that time. Meanwhile matters have matured. It is recognized that isolated definition of the effort of analog multiplication, for instance, would be just as inappropriate on the part ofthe chip designer as determination of the weights by simulation, without allowing for the computing accuracy that can be achieved, on the part of the user.

Author : Christopher Michael
Publisher : Springer Science & Business Media
ISBN 13 : 9780792392996
Total Pages : 220 pages
Book Rating : 4.9X/5 ( download)

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Download or read book Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits written by Christopher Michael and published by Springer Science & Business Media. This book was released on 1993-01-31 with total page 220 pages. Available in PDF, EPUB and Kindle. Book excerpt: As MOS devices are scaled to meet increasingly demanding circuit specifications, process variations have a greater effect on the reliability of circuit performance. For this reason, statistical techniques are required to design integrated circuits with maximum yield. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits describes a statistical circuit simulation and optimization environment for VLSI circuit designers. The first step toward accomplishing statistical circuit design and optimization is the development of an accurate CAD tool capable of performing statistical simulation. This tool must be based on a statistical model which comprehends the effect of device and circuit characteristics, such as device size, bias, and circuit layout, which are under the control of the circuit designer on the variability of circuit performance. The distinctive feature of the CAD tool described in this book is its ability to accurately model and simulate the effect in both intra- and inter-die process variability on analog/digital circuits, accounting for the effects of the aforementioned device and circuit characteristics. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits serves as an excellent reference for those working in the field, and may be used as the text for an advanced course on the subject.