Total Reflection X Ray Fluorescence Analysis And Related Methods

Author : Reinhold Klockenkämper
Publisher : John Wiley & Sons
ISBN 13 : 1118460278
Total Pages : 554 pages
Book Rating : 4.76/5 ( download)

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Download or read book Total-Reflection X-Ray Fluorescence Analysis and Related Methods written by Reinhold Klockenkämper and published by John Wiley & Sons. This book was released on 2015-01-27 with total page 554 pages. Available in PDF, EPUB and Kindle. Book excerpt: Explores the uses of TXRF in micro- and trace analysis, and in surface- and near-surface-layer analysis • Pinpoints new applications of TRXF in different fields of biology, biomonitoring, material and life sciences, medicine, toxicology, forensics, art history, and archaeometry • Updated and detailed sections on sample preparation taking into account nano- and picoliter techniques • Offers helpful tips on performing analyses, including sample preparations, and spectra recording and interpretation • Includes some 700 references for further study

Author :
Publisher :
ISBN 13 :
Total Pages : 676 pages
Book Rating : 4.21/5 ( download)

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Download or read book Advances in X-ray Analysis written by and published by . This book was released on 1969 with total page 676 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author : Gilfrich
Publisher : Kluwer Academic Publishers
ISBN 13 :
Total Pages : 792 pages
Book Rating : 4.25/5 ( download)

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Download or read book Advances in X-Ray Analysis written by Gilfrich and published by Kluwer Academic Publishers. This book was released on 1994 with total page 792 pages. Available in PDF, EPUB and Kindle. Book excerpt: Selected papers from the 1993 Denver Conference on Applications of X-Ray Analysis. International experts present the latest research in the field, with special coverage of the impact of personal computers and sophisticated software on the development of X-ray instrumentation and techniques. Annotati

Author : Eva Margui
Publisher : Momentum Press
ISBN 13 : 1606503936
Total Pages : 149 pages
Book Rating : 4.35/5 ( download)

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Download or read book X-Ray Fluorescence Spectrometry and Related Techniques written by Eva Margui and published by Momentum Press. This book was released on 2013-01-25 with total page 149 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF. Those recent technological advances, including the design of low-power micro- focus tubes and novel X-ray optics and detectors, have made it possible to extend XRF to the analysis of low-Z elements and to obtain 2D or 3D information on a micrometer-scale. And, the recent development and commercialization of bench top and portable instrumentation, offering extreme simplicity of operation in a low-cost design, have extended the applications of XRF to many more analytical problems.

Author : Burkhard Beckhoff
Publisher : Springer Science & Business Media
ISBN 13 : 3540367225
Total Pages : 897 pages
Book Rating : 4.22/5 ( download)

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Download or read book Handbook of Practical X-Ray Fluorescence Analysis written by Burkhard Beckhoff and published by Springer Science & Business Media. This book was released on 2007-05-18 with total page 897 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.

Author : Dick K. G. de Boer
Publisher :
ISBN 13 :
Total Pages : 277 pages
Book Rating : 4.39/5 ( download)

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Download or read book Total Reflection X-ray Fluorescence Analysis written by Dick K. G. de Boer and published by . This book was released on 1997 with total page 277 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author : Vivek K. Singh
Publisher : John Wiley & Sons
ISBN 13 : 1119645549
Total Pages : 692 pages
Book Rating : 4.42/5 ( download)

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Download or read book X-Ray Fluorescence in Biological Sciences written by Vivek K. Singh and published by John Wiley & Sons. This book was released on 2022-03-28 with total page 692 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-Ray Fluorescence in Biological Sciences Discover a comprehensive exploration of X-ray fluorescence in chemical biology and the clinical and plant sciences In X-Ray Fluorescence in Biological Sciences: Principles, Instrumentation, and Applications, a team of accomplished researchers delivers extensive coverage of the application of X-ray fluorescence (XRF) in the biological sciences, including chemical biology, clinical science, and plant science. The book also explores recent advances in XRF imaging techniques in these fields. The authors focus on understanding and investigating the intercellular structures and metals in plant cells, with advanced discussions of recently developed micro-analytical methods, like energy dispersive X-ray fluorescence spectrometry (EDXRF), total reflection X-ray fluorescence spectrometry (TXRF), micro-proton induced X-ray emission (micro-PIXE), electron probe X-ray microanalysis (EPXMA), synchrotron-based X-ray fluorescence microscopy (SXRF, SRIXE, or micro-XRF) and secondary ion mass spectrometry (SIMS). With thorough descriptions of protocols and practical approaches, the book also includes: A thorough introduction to the historical background and fundamentals of X-ray fluorescence, as well as recent developments in X-ray fluorescence analysis Comprehensive explorations of the general properties, production, and detection of X-rays and the preparation of samples for X-ray fluorescence analysis Practical discussions of the quantification of prepared samples observed under X-ray fluorescence and the relation between precision and beam size and sample amount In-depth examinations of wavelength-dispersive X-ray fluorescence and living materials Perfect for students and researchers studying the natural and chemical sciences, medical biology, plant physiology, agriculture, and botany, X-Ray Fluorescence in Biological Sciences: Principles, Instrumentation, and Applications will also earn a place in the libraries of researchers at biotechnology companies.

Author : Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods
Publisher :
ISBN 13 :
Total Pages : 1544 pages
Book Rating : 4.85/5 ( download)

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Download or read book Total reflection X-ray fluorescence analysis : 7th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF'98), Austin, TX (USA), September 1998 written by Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods and published by . This book was released on 1999 with total page 1544 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author : Michael Haschke
Publisher : John Wiley & Sons
ISBN 13 : 3527344632
Total Pages : 496 pages
Book Rating : 4.35/5 ( download)

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Download or read book X-Ray Fluorescence Spectroscopy for Laboratory Applications written by Michael Haschke and published by John Wiley & Sons. This book was released on 2021-04-05 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides comprehensive coverage on using X-ray fluorescence for laboratory applications This book focuses on the practical aspects of X-ray fluorescence (XRF) spectroscopy and discusses the requirements for a successful sample analysis, such as sample preparation, measurement techniques and calibration, as well as the quality of the analysis results. X-Ray Fluorescence Spectroscopy for Laboratory Applications begins with a short overview of the physical fundamentals of the generation of X-rays and their interaction with the sample material, followed by a presentation of the different methods of sample preparation in dependence on the quality of the source material and the objective of the measurement. After a short description of the different available equipment types and their respective performance, the book provides in-depth information on the choice of the optimal measurement conditions and the processing of the measurement results. It covers instrument types for XRF; acquisition and evaluation of X-Ray spectra; analytical errors; analysis of homogeneous materials, powders, and liquids; special applications of XRF; process control and automation. An important resource for the analytical chemist, providing concrete guidelines and support for everyday analyses Focuses on daily laboratory work with commercially available devices Offers a unique compilation of knowledge and best practices from equipment manufacturers and users Covers the entire work process: sample preparation, the actual measurement, data processing, assessment of uncertainty, and accuracy of the obtained results X-Ray Fluorescence Spectroscopy for Laboratory Applications appeals to analytical chemists, analytical laboratories, materials scientists, environmental chemists, chemical engineers, biotechnologists, and pharma engineers.

Author :
Publisher :
ISBN 13 :
Total Pages : 5 pages
Book Rating : 4.46/5 ( download)

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Download or read book Total Reflection X-ray Fluorescence written by and published by . This book was released on 1997 with total page 5 pages. Available in PDF, EPUB and Kindle. Book excerpt: Total reflection X-Ray Fluorescence (TXRF) is a widely used technique in which the normal trace element detection capability of hard x-ray fluorescence (XRF) is enhanced by use of an x-ray reflective substrate. TXRF is more sensitive than normal photon induced XRF due to the reduction of the substrate scattering and fluorescence signals. This reduction comes about because in total external reflection, the photon field only penetrates about 20 Å into the surface, instead of typically 50 [mu]m for a silicon substrate at normal incidence for 10 KeV photons. The technique is used in many fields of trace element analysis, and is widely used in the determination of metal impurity concentrations on and in the surface of silicon wafers. The Semiconductor Industry Association roadmap (SIA) indicates a need for wafer contamination detection at the 107atoms/cm2 level in the next few years. Current commercial systems using rotating anode x-ray sources presently routinely operate with a sensitivity level of around 101° atoms/cm2 and this has led to interest in the use of synchrotron radiation to extend the sensitivity by three orders of magnitude. The pioneering work of Pianetta and co-workers at SSRL has clearly shown that this should be possible, using a fully optimized source and detector. The purpose of this work is to determine whether ALS would be a suitable source for this type of highly sensitive wafer TXRF. At first look it appears improbable as the SSRL work used a high flux multipole wiggler source, and it is clear that the detected fluorescence for relevant concentrations is small. In addition, SSRL operates at 3.0 GeV rather than 1.9 GeV, and is therefore more naturally suited to hard x-ray experiments. The aim of this work was therefore to establish a theoretical model for the scattering and fluorescence processes, so that one could predict the differences between alternative geometries and select an optimum configuration.