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Author : Brian Lowe
Publisher :
ISBN 13 :
Total Pages : 420 pages
Book Rating : 4.09/5 ( download)
Download or read book The Fundamentals of Mixed Signal Testing written by Brian Lowe and published by . This book was released on 2002 with total page 420 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Gordon W. Roberts
Publisher :
ISBN 13 : 9780199796212
Total Pages : 0 pages
Book Rating : 4.11/5 ( download)
Download or read book An Introduction to Mixed-signal IC Test and Measurement written by Gordon W. Roberts and published by . This book was released on 2012 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topicswill help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples,exercises and problems.
Author : Mark Burns
Publisher : Oxford University Press, USA
ISBN 13 : 9780195140163
Total Pages : 684 pages
Book Rating : 4.68/5 ( download)
Download or read book An Introduction to Mixed-signal IC Test and Measurement written by Mark Burns and published by Oxford University Press, USA. This book was released on 2001 with total page 684 pages. Available in PDF, EPUB and Kindle. Book excerpt: Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on the subject of mixed-signal testing. While many books have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement. This book was written in response ot the shortage of basic course material for mixed-signal test and measurement. The book assumes a solid background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary. This material is designed to be useful as both a university textbook and as a reference manual for the beginning professional test engineer. The prerequisite for this book is a junior level course in linear continuous-time and discrete-time systems, as well as exposure ot elementary probability and statistical concepts. Chapter 1 presents an introduction to the context in which mixed-singal testing is performed and why it is necessary. Chapter 2 examines the process by which test programs are generated, from device data sheet to test plan to test code. Test program structure and functionality are also discussed in Chapter 2. Chapter 3 introduces basic DC measurement definitions, including continuity, leakage, offset, gain, DC power supply rejection ratio, and many other types of fundamental DC measurements. Chapter 4 covers the basics of absolute accuracy, resolution, software calibration, standards traceability, and measurement repeatability. In addition, basic data analysis is presented in Chapter 4. A more thorough treatment of data analysis and statistical analysis is delayed until Chapter 15. Chapter 5 takes a closer look at the architecture of a generic mixed-signal ATE tester. The generic tester includes instruments such as DC sources, meters, waveform digitizers, arbitrary waveform generators, and digital pattern generators with source and capture functionality. Chapter 6 presents an introduction to both ADC and DAC sampling theory. DAC sampling theory is applicable to both DAC circuits in the device under test and to the arbitrary waveform generators in a mixed-signal tester. ADC sampling theory is applicable to both ADC circuits in the device under test and to waveform digitizers in a mixed-signal tester. Coherent multi-tone sample sets are also introduced as an introduction to DSP based testing. Chapter 7 further develops sampling theory concepts and DSP-based testing methodologies, which are at the core of many mixed-signal test and measurement techniques. FFT fundamentals, windowing, frequency domain filtering, and other DSP-based testing fundamentals are covered in Chapter 6 and 7. Chapter 8 shows how basic AC channel tests can be performed economicaly using DSP-based testing. This chapter covers only non-sampled channels, consisting of combinations of op-amps, analog filters, PGAs and other continuous-time circuits. Chapter 9 explores many of these same tests as they are applied to sampled channels, which include DACs, ADCs, sample and hold (S/H) amplifiers, etc. Chapter 10 explains how the basic accuracy of ATE test equipment can be extended using specialized software routines. This subject is not necessarily taught in formal ATE tester classes, yet it is critical in the accurate measurement of many DUT performance parameters. Testing of DACs is covered in Chapter 11. Several kinds of DACs are studied, including traditional binary-weighted, resistive ladder, pulse with modulation (PWM), and sigma delta architectures. Traditional measurements like INL, DNL and absolute error are discussed. Chapter 12 builds upon the concepts in Chapter 11 to show how ADCs are commonly tested. Again, several different kinds of ADC's are studied, including binary-weighted, dual-slope, flash, semi-flash, and sigma-delta architectures. The weaknesses of each design are expalined, as well as the common methodologies used to probe their weaknesses. Chapter 13 explores the gray art of mixed-signal DIB design. Topics of interest include component selection, power and ground layout, crosstalk, shielding, transmission lines, and tester loading. Chapter 13 also illustrates several common DIB circuits and their use in mixed-signal testing. Chapter 14 gives a brief introduction to some of the techniques for analog and mixed-signal design for test. There are fewer structured approaches for mixed-signal DfT than for purely digital DfT. The more common ad-hoc methods are explained, as well as some of the industry standards such as IEEE Std. 1149.1 and 1149.4. A brief review of statistical analysis and Gaussian distributions is presented in Chapter 15. This chapter also shows how measurement results can be analyzed and viewed using a variety of software tools and display formats. Datalogs, shmoo plots, and histograms are discussed. Also, statistical process control (SPC) is explained, including a discussion of process control metrics such as Cp and Cpk. Chapter 16 examines the economis of production testing, The economics of testing are affected by many factors such as equipment purchase price, test floor overhead costs, test time, dual-head testing, multi-site testing, and time to market. A test engineer's debugging skills heavily impacts time to market. Chapter 16 examines the test debugging process to attempt to set down some general guidelines for debugging mixed-signal test programs. Finally, emerging trends that affect test economics and test development time are presented in Chapter 16. Some or all these trends will shape the future course of mixed-siganl test and measurement.
Author : Karl Stephan
Publisher : John Wiley & Sons
ISBN 13 : 1118782666
Total Pages : 535 pages
Book Rating : 4.68/5 ( download)
Download or read book Analog and Mixed-Signal Electronics written by Karl Stephan and published by John Wiley & Sons. This book was released on 2015-04-06 with total page 535 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical guide to analog and mixed-signal electronics, with an emphasis on design problems and applications This book provides an in-depth coverage of essential analog and mixed-signal topics such as power amplifiers, active filters, noise and dynamic range, analog-to-digital and digital-to-analog conversion techniques, phase-locked loops, and switching power supplies. Readers will learn the basics of linear systems, types of nonlinearities and their effects, op-amp circuits, the high-gain analog filter-amplifier, and signal generation. The author uses system design examples to motivate theoretical explanations and covers system-level topics not found in most textbooks. Provides references for further study and problems at the end of each chapter Includes an appendix describing test equipment useful for analog and mixed-signal work Examines the basics of linear systems, types of nonlinearities and their effects, op-amp circuits, the high-gain analog filter-amplifier, and signal generation Comprehensive and detailed, Analog and Mixed-Signal Electronics is a great introduction to analog and mixed-signal electronics for EE undergraduates, advanced electronics students, and for those involved in computer engineering, biomedical engineering, computer science, and physics.
Author : Matthew Mahoney
Publisher : John Wiley & Sons
ISBN 13 : 9780818607851
Total Pages : 272 pages
Book Rating : 4.58/5 ( download)
Download or read book DSP-Based Testing of Analog and Mixed-Signal Circuits written by Matthew Mahoney and published by John Wiley & Sons. This book was released on 1987-05-11 with total page 272 pages. Available in PDF, EPUB and Kindle. Book excerpt: Answers the commonly asked questions about how digital signal processing-based machines work and what role DSP plays in the process. It shows you how DSP performs in real-test situations and uses mathematical concepts rather than derivations. The text addresses difficult test problems and their solutions resulting from the union of automatic test equipment (ATE) and DSP. The author establishes a philosophy of DSP-based testing describing how to think, how to approach a problem, how to create a solution, and how to determine if it really works properly.
Author : M. Bushnell
Publisher : Springer Science & Business Media
ISBN 13 : 0306470403
Total Pages : 690 pages
Book Rating : 4.00/5 ( download)
Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Author : Mark Baker
Publisher : Elsevier
ISBN 13 : 9780080491066
Total Pages : 279 pages
Book Rating : 4.65/5 ( download)
Download or read book Demystifying Mixed Signal Test Methods written by Mark Baker and published by Elsevier. This book was released on 2003-06-03 with total page 279 pages. Available in PDF, EPUB and Kindle. Book excerpt: Mixed Signal Test Methods Demystified is a less theoretical, less mathematical, and more applications-oriented approach than other books available on the topic. In effect, this book will give readers a "just in time" understanding of the essentials of mixed signal testing techniques. Emphasis will be on commonly used devices and systems (such as PLLs and DSP) that engineers encounter in their daily tasks. Sampling theory is covered in detail, as this is the foundation for understanding all mixed signal testing technique, and readers will have a strong intuitive grasp of this topic after finishing this book. Baker aims to develop an intuitive understanding of mixed signal testing that minimizes the mathematics required and is germane to the sort of testing requirements found in typical engineering situations. *Takes a less theoretical, less mathematical, and more applications-oriented approach *Emphasizes commonly used devices and systems that engineers encounter in their daily tasks *Aims to develop an intuitive understanding of mixed signal testing
Author : IEEE Staff
Publisher :
ISBN 13 : 9781467367332
Total Pages : pages
Book Rating : 4.38/5 ( download)
Download or read book 2015 20th International Mixed Signal Testing Workshop (IMSTW) written by IEEE Staff and published by . This book was released on 2015-06-24 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The role of nano electronic systems is expanding in every facet of modern life One of the major bottlenecks nowadays for such systems is the high cost of post manufacturing testing of their analog and mixed signal functions, in order to guarantee outgoing quality while not sacrificing yield In addition, safety critical and mission critical systems need to be equipped with self test and fault tolerance capabilities so as to guarantee reliable operation even in harsh environments For such systems, diagnosing the sources of failures occurring in the field of operation is of vital importance, in order to apply corrective actions and to prevent failure reoccurrence Diagnosis is also of vital importance to quickly identify failures in the first prototypes and to shed light on the manufacturing failure mechanisms The International Mixed Signals Testing Workshop is one of the main forums that bring together the test community to discuss ideas and views on the above challenges
Author : B. Courtois
Publisher : Springer Science & Business Media
ISBN 13 : 9401595062
Total Pages : 315 pages
Book Rating : 4.63/5 ( download)
Download or read book Microelectronics Education written by B. Courtois and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 315 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is the third edition of the European Workshop on Microelectronics Education (EWME). A steady-state regime has now been reached. An international community of university teachers is constituted; they exchange their experience and their pedagogical tools. They discuss the best ways to transfer the rapidly changing techniques to their students, and to introduce them to the new physical and mathematical concepts and models for the innovative techniques, devices, circuits and design methods. The number of abstracts submitted to EWME 2000 (about one hundred) enabled the scientific committee to proceed to a clear selection. EWME is a European meeting. Indeed, authors from 20 different European countries contribute to this volume. Nevertheless, the participation of authors from Brazil, Canada, China, New Zealand, and USA, shows that the workshop gradually attains an international dimension. th The 20 century can be characterized as the "century of electron". The electron, as an elementary particle, was discovered by J.J. Thomson in 1897, and was rapidly used to transfer energy and information. Thanks to electron, universe and micro-cosmos could be explored. Electron became the omnipotent and omnipresent, almost immaterial, angel of our W orId. This was made possible thanks to electronics and, for the last 30 years, to microelectronics. Microelectronics not only modified and even radically transformed the industrial and the every-day landscapes, but it also led to the so-called "information revolution" with which begins the 21 st century.
Author : Laung-Terng Wang
Publisher : Elsevier
ISBN 13 : 9780080474793
Total Pages : 808 pages
Book Rating : 4.99/5 ( download)
Download or read book VLSI Test Principles and Architectures written by Laung-Terng Wang and published by Elsevier. This book was released on 2006-08-14 with total page 808 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
