Terrestrial Neutron Induced Soft Error In Advanced Memory Devices

Author : Takashi Nakamura
Publisher : World Scientific
ISBN 13 : 9812778810
Total Pages : 364 pages
Book Rating : 4.19/5 ( download)

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Download or read book Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices written by Takashi Nakamura and published by World Scientific. This book was released on 2008 with total page 364 pages. Available in PDF, EPUB and Kindle. Book excerpt: Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.

Author : Takashi Nakamura
Publisher : World Scientific
ISBN 13 : 9814472395
Total Pages : 364 pages
Book Rating : 4.95/5 ( download)

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Download or read book Terrestrial Neutron-induced Soft Error In Advanced Memory Devices written by Takashi Nakamura and published by World Scientific. This book was released on 2008-03-28 with total page 364 pages. Available in PDF, EPUB and Kindle. Book excerpt: Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.

Author : Takashi Nakamura
Publisher : World Scientific
ISBN 13 : 9812778829
Total Pages : 364 pages
Book Rating : 4.26/5 ( download)

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Download or read book Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices written by Takashi Nakamura and published by World Scientific. This book was released on 2008 with total page 364 pages. Available in PDF, EPUB and Kindle. Book excerpt: There are numerous elaborate and comprehensive textbooks and guidelines on stroke. However, busy clinicians are constantly bombarded with new knowledge for an infinite number of medical conditions. It becomes a challenge for them to tease out the important information that will help guide them through the care of the patient they have right before them. This handbook is thus conceptualized with both the busy clinician and the stroke patient needing urgent treatment in mind. By providing only essential information in a standard and user-friendly layout, it assists clinicians in making real-time decisions quickly and effectively with actual step-by-step guides on specific issues relevant to the care of stroke patients.The use of this practical handbook is instinctive with the topics arranged in chronological order, simulating the actual clinical scenario from a prehospital setting, consultation in the emergency room, admission to the hospital, to secondary prevention in the clinic. With contributions from over 30 stroke experts in Southeast Asia, this handbook is widely applicable in different medical settings and will certainly appeal to stroke specialists, general practitioners, nurses, paramedics, and medical students alike.

Author : Eishi H. Ibe
Publisher : John Wiley & Sons
ISBN 13 : 1118479297
Total Pages : 292 pages
Book Rating : 4.92/5 ( download)

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Download or read book Terrestrial Radiation Effects in ULSI Devices and Electronic Systems written by Eishi H. Ibe and published by John Wiley & Sons. This book was released on 2015-03-02 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithms Covers both terrestrial and avionic-level conditions Logically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summary Written by a widely-recognized authority in soft-errors in electronic devices Code samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.

Author : Nobuyasu Kanekawa
Publisher : Springer Science & Business Media
ISBN 13 : 144196715X
Total Pages : 226 pages
Book Rating : 4.52/5 ( download)

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Download or read book Dependability in Electronic Systems written by Nobuyasu Kanekawa and published by Springer Science & Business Media. This book was released on 2010-11-08 with total page 226 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers the practical application of dependable electronic systems in real industry, such as space, train control and automotive control systems, and network servers/routers. The impact from intermittent errors caused by environmental radiation (neutrons and alpha particles) and EMI (Electro-Magnetic Interference) are introduced together with their most advanced countermeasures. Power Integration is included as one of the most important bases of dependability in electronic systems. Fundamental technical background is provided, along with practical design examples. Readers will obtain an overall picture of dependability from failure causes to countermeasures for their relevant systems or products, and therefore, will be able to select the best choice for maximum dependability.

Author : Jean-Luc Autran
Publisher : CRC Press
ISBN 13 : 146659084X
Total Pages : 432 pages
Book Rating : 4.47/5 ( download)

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Download or read book Soft Errors written by Jean-Luc Autran and published by CRC Press. This book was released on 2017-12-19 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.

Author : Shojiro Asai
Publisher : Springer
ISBN 13 : 4431565949
Total Pages : 800 pages
Book Rating : 4.49/5 ( download)

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Download or read book VLSI Design and Test for Systems Dependability written by Shojiro Asai and published by Springer. This book was released on 2018-07-20 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.

Author : European Organization for Nuclear Research
Publisher :
ISBN 13 :
Total Pages : 576 pages
Book Rating : 4.94/5 ( download)

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Download or read book CERN Courier written by European Organization for Nuclear Research and published by . This book was released on 2008 with total page 576 pages. Available in PDF, EPUB and Kindle. Book excerpt: This journal is devoted to the latest research on physics, publishing articles on everything from elementary particle behavior to black holes and the history of the universe.

Author :
Publisher :
ISBN 13 :
Total Pages : 246 pages
Book Rating : 4.83/5 ( download)

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Download or read book International Integrated Reliability Workshop Final Report written by and published by . This book was released on 2002 with total page 246 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author : W. Rosenstock
Publisher :
ISBN 13 :
Total Pages : 6 pages
Book Rating : 4.99/5 ( download)

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Download or read book Neutron Induced Soft Errors in Digital Surveillance Technology written by W. Rosenstock and published by . This book was released on 2001 with total page 6 pages. Available in PDF, EPUB and Kindle. Book excerpt: