Semiconductor Measurements And Instrumentation

Author : W. R. Runyan
Publisher : McGraw Hill Professional
ISBN 13 : 9780070576971
Total Pages : 468 pages
Book Rating : 4.71/5 ( download)

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Download or read book Semiconductor Measurements and Instrumentation written by W. R. Runyan and published by McGraw Hill Professional. This book was released on 1998 with total page 468 pages. Available in PDF, EPUB and Kindle. Book excerpt: A reference on semiconductor characterization tools, this volume offers explanations of the advanced and traditional techniques for evaluating different criterion: crystal defects, impurity concentration, lifetime, film thickness, resistivity, and such critical electrical properties as mobility, Hall effect, and conductivity type.

Author : W. R. Runyan
Publisher : McGraw-Hill Companies
ISBN 13 :
Total Pages : 298 pages
Book Rating : 4.07/5 ( download)

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Download or read book Semiconductor Measurements and Instrumentation written by W. R. Runyan and published by McGraw-Hill Companies. This book was released on 1975 with total page 298 pages. Available in PDF, EPUB and Kindle. Book excerpt: Crystal orientation. Crystallographic defects and their observation. Resistivity and carrier-concentration measurements. Lifetime. Mobility, hall, and type measurements. Thickness measurements. Preparation of samples for microscopic examination. Microscopy and photography. The electron microscope and other analytical instruments.

Author : United States. National Bureau of Standards
Publisher :
ISBN 13 :
Total Pages : 64 pages
Book Rating : 4.10/5 ( download)

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Download or read book Semiconductor Measurement Technology written by United States. National Bureau of Standards and published by . This book was released on 1982 with total page 64 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author : National Institute of Standards and Technology (U.S.)
Publisher :
ISBN 13 :
Total Pages : 140 pages
Book Rating : 4.93/5 ( download)

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Download or read book Semiconductor Measurement Technology written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1990 with total page 140 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author : Dieter K. Schroder
Publisher : John Wiley & Sons
ISBN 13 : 0471739065
Total Pages : 800 pages
Book Rating : 4.67/5 ( download)

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Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

Author : Richard Haight
Publisher : World Scientific
ISBN 13 : 9814322849
Total Pages : 346 pages
Book Rating : 4.43/5 ( download)

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Download or read book Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization written by Richard Haight and published by World Scientific. This book was released on 2012 with total page 346 pages. Available in PDF, EPUB and Kindle. Book excerpt: As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This Handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures.

Author : Alain C. Diebold
Publisher : CRC Press
ISBN 13 : 0203904540
Total Pages : 703 pages
Book Rating : 4.41/5 ( download)

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Download or read book Handbook of Silicon Semiconductor Metrology written by Alain C. Diebold and published by CRC Press. This book was released on 2001-06-29 with total page 703 pages. Available in PDF, EPUB and Kindle. Book excerpt: Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay

Author : Alan S. Morris
Publisher : Academic Press
ISBN 13 : 0128011327
Total Pages : 727 pages
Book Rating : 4.24/5 ( download)

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Download or read book Measurement and Instrumentation written by Alan S. Morris and published by Academic Press. This book was released on 2015-08-13 with total page 727 pages. Available in PDF, EPUB and Kindle. Book excerpt: Measurement and Instrumentation: Theory and Application, Second Edition, introduces undergraduate engineering students to measurement principles and the range of sensors and instruments used for measuring physical variables. This updated edition provides new coverage of the latest developments in measurement technologies, including smart sensors, intelligent instruments, microsensors, digital recorders, displays, and interfaces, also featuring chapters on data acquisition and signal processing with LabVIEW from Dr. Reza Langari. Written clearly and comprehensively, this text provides students and recently graduated engineers with the knowledge and tools to design and build measurement systems for virtually any engineering application. Provides early coverage of measurement system design to facilitate a better framework for understanding the importance of studying measurement and instrumentation Covers the latest developments in measurement technologies, including smart sensors, intelligent instruments, microsensors, digital recorders, displays, and interfaces Includes significant material on data acquisition and signal processing with LabVIEW Extensive coverage of measurement uncertainty aids students’ ability to determine the accuracy of instruments and measurement systems

Author : United States. National Bureau of Standards
Publisher :
ISBN 13 :
Total Pages : 64 pages
Book Rating : 4.08/5 ( download)

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Download or read book Methods of Measurement for Semiconductor Materials, Process Control, and Devices written by United States. National Bureau of Standards and published by . This book was released on 1972-04 with total page 64 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author : W. Murray Bullis
Publisher :
ISBN 13 :
Total Pages : 28 pages
Book Rating : 4.24/5 ( download)

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Download or read book Measurement Methods for the Semiconductor Device Industry written by W. Murray Bullis and published by . This book was released on 1969 with total page 28 pages. Available in PDF, EPUB and Kindle. Book excerpt: