Scanning Force Microscopy

Author : Bert Voigtländer
Publisher : Springer
ISBN 13 : 303013654X
Total Pages : 331 pages
Book Rating : 4.43/5 ( download)

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Download or read book Atomic Force Microscopy written by Bert Voigtländer and published by Springer. This book was released on 2019-05-23 with total page 331 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.

Author : Bert Voigtländer
Publisher : Springer
ISBN 13 : 3662452405
Total Pages : 375 pages
Book Rating : 4.00/5 ( download)

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Download or read book Scanning Probe Microscopy written by Bert Voigtländer and published by Springer. This book was released on 2015-02-24 with total page 375 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

Author : G. Julius Vancso
Publisher : Springer Science & Business Media
ISBN 13 : 3642012310
Total Pages : 258 pages
Book Rating : 4.10/5 ( download)

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Download or read book Scanning Force Microscopy of Polymers written by G. Julius Vancso and published by Springer Science & Business Media. This book was released on 2010-08-02 with total page 258 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scope of the Book Synthetic and natural polymers exhibit a complex structural and morphological hierarchy on multiple length scales [1], which determines their performance. Thus, research aiming at visualizing structure and morphology using a multitude of microscopy techniques has received considerable attention since the early days of polymer science and technology. Various well-developed techniques such as optical microscopy and different forms of electron microscopy (Scanning Electron Micr- copy, SEM; Transmission Electron Microscopy, TEM; Environmental Scanning Electron Microscopy, ESEM) allow one to view polymeric structure at different levels of magni?cation. These classical techniques, and their applications to po- mers, are well documented in the literature [2, 3]. The invention of Scanning Tunneling Microscopy (STM) inspired the devel- ment of Atomic Force Microscopy (AFM) and other forms of scanning proximity microscopes in the late 1980s [4, 5]. AFM, unlike STM, can be used to image n- conducting specimens such as polymers. In addition, AFM imaging is feasible in liquids, which has several advantages. Using liquid imaging cells the forces between specimen and AFM probe are drastically reduced, thus sample damage is prevented. In addition, the use of water as imaging medium opened up new applications aiming at imaging, characterizing, and analyzing biologically important systems.

Author : Dror Sarid
Publisher : Oxford University Press, USA
ISBN 13 : 019509204X
Total Pages : 284 pages
Book Rating : 4.42/5 ( download)

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Download or read book Scanning Force Microscopy written by Dror Sarid and published by Oxford University Press, USA. This book was released on 1994 with total page 284 pages. Available in PDF, EPUB and Kindle. Book excerpt: This edition updates the survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography.

Author : Samuel H. Cohen
Publisher : Springer Science & Business Media
ISBN 13 : 0306448904
Total Pages : 468 pages
Book Rating : 4.04/5 ( download)

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Download or read book Atomic Force Microscopy/Scanning Tunneling Microscopy written by Samuel H. Cohen and published by Springer Science & Business Media. This book was released on 1994 with total page 468 pages. Available in PDF, EPUB and Kindle. Book excerpt: Papers presented at the first US Army Natick Research, Development and Engineering Center Symposium on [title], held in Natick, Mass., June 1993. The various symposium topics included application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments including new probe microscopies. The procee.

Author : Peter Eaton
Publisher : Oxford University Press
ISBN 13 : 0199570450
Total Pages : 257 pages
Book Rating : 4.54/5 ( download)

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Download or read book Atomic Force Microscopy written by Peter Eaton and published by Oxford University Press. This book was released on 2010-03-25 with total page 257 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.

Author : W. Richard Bowen
Publisher : Butterworth-Heinemann
ISBN 13 : 0080949576
Total Pages : 300 pages
Book Rating : 4.74/5 ( download)

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Download or read book Atomic Force Microscopy in Process Engineering written by W. Richard Bowen and published by Butterworth-Heinemann. This book was released on 2009-06-30 with total page 300 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM. The book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. Fundamentals and techniques are concisely described, while specific benefits for process engineering are clearly defined and illustrated. Key content includes: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the development of fouling resistant membranes; nanoscale pharmaceutical analysis; nanoengineering for cellular sensing; polymers on surfaces; micro and nanoscale rheometry. Atomic force microscopy (AFM) is an important tool for process engineers and scientists as it enables improved processes and products The only book dealing with the theory and practical applications of atomic force microscopy in process engineering Provides best-practice guidance and experience on using AFM for process and product improvement

Author : Umberto Celano
Publisher : Springer
ISBN 13 : 3030156125
Total Pages : 408 pages
Book Rating : 4.21/5 ( download)

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Download or read book Electrical Atomic Force Microscopy for Nanoelectronics written by Umberto Celano and published by Springer. This book was released on 2019-08-01 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt: The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.

Author : Greg Haugstad
Publisher : John Wiley & Sons
ISBN 13 : 0470638826
Total Pages : 496 pages
Book Rating : 4.28/5 ( download)

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Download or read book Atomic Force Microscopy written by Greg Haugstad and published by John Wiley & Sons. This book was released on 2012-09-24 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. “Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com”

Author : Seizo Morita
Publisher : Springer Science & Business Media
ISBN 13 : 3540343156
Total Pages : 207 pages
Book Rating : 4.58/5 ( download)

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Download or read book Roadmap of Scanning Probe Microscopy written by Seizo Morita and published by Springer Science & Business Media. This book was released on 2006-12-30 with total page 207 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.