Reliability Of Electronic Components

Author : Titu I. Bajenescu
Publisher : Springer Science & Business Media
ISBN 13 : 3642585051
Total Pages : 547 pages
Book Rating : 4.50/5 ( download)

DOWNLOAD NOW!

Download or read book Reliability of Electronic Components written by Titu I. Bajenescu and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 547 pages. Available in PDF, EPUB and Kindle. Book excerpt: This application-oriented professional book explains why components fail, addressing the needs of engineers who apply reliability principles in design, manufacture, testing and field service. A detailed index, a glossary, acronym lists, reliability dictionaries and a rich specific bibliography complete the book.

Author : Milton Ohring
Publisher : Academic Press
ISBN 13 : 0080575528
Total Pages : 759 pages
Book Rating : 4.20/5 ( download)

DOWNLOAD NOW!

Download or read book Reliability and Failure of Electronic Materials and Devices written by Milton Ohring and published by Academic Press. This book was released on 2014-10-14 with total page 759 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites

Author : Eugene R. Hnatek
Publisher : CRC Press
ISBN 13 : 9780203909089
Total Pages : 472 pages
Book Rating : 4.89/5 ( download)

DOWNLOAD NOW!

Download or read book Practical Reliability Of Electronic Equipment And Products written by Eugene R. Hnatek and published by CRC Press. This book was released on 2002-10-25 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt: Examining numerous examples of highly sensitive products, this book reviews basic reliability mathematics, describes robust design practices, and discusses the process of selecting suppliers and components. He focuses on the specific issues of thermal management, electrostatic discharge, electromagnetic compatibility, printed wiring assembly, environmental stress testing, and failure analysis. The book presents methods for meeting the reliability goals established for the manufacture of electronic product hardware and addresses the development of reliable software. The appendix provides example guidelines for the derating of electrical and electromechanical components.

Author : Titu I. Băjenescu
Publisher : Artech House
ISBN 13 : 1596934360
Total Pages : 706 pages
Book Rating : 4.68/5 ( download)

DOWNLOAD NOW!

Download or read book Component Reliability for Electronic Systems written by Titu I. Băjenescu and published by Artech House. This book was released on 2010 with total page 706 pages. Available in PDF, EPUB and Kindle. Book excerpt: The main reason for the premature breakdown of today's electronic products (computers, cars, tools, appliances, etc.) is the failure of the components used to build these products. Today professionals are looking for effective ways to minimize the degradation of electronic components to help ensure longer-lasting, more technically sound products and systems. This practical book offers engineers specific guidance on how to design more reliable components and build more reliable electronic systems. Professionals learn how to optimize a virtual component prototype, accurately monitor product reliability during the entire production process, and add the burn-in and selection procedures that are the most appropriate for the intended applications. Moreover, the book helps system designers ensure that all components are correctly applied, margins are adequate, wear-out failure modes are prevented during the expected duration of life, and system interfaces cannot lead to failure.

Author : Dhanasekharan Natarajan
Publisher : Springer
ISBN 13 : 3319091115
Total Pages : 156 pages
Book Rating : 4.12/5 ( download)

DOWNLOAD NOW!

Download or read book Reliable Design of Electronic Equipment written by Dhanasekharan Natarajan and published by Springer. This book was released on 2014-08-02 with total page 156 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explains reliability techniques with examples from electronics design for the benefit of engineers. It presents the application of de-rating, FMEA, overstress analyses and reliability improvement tests for designing reliable electronic equipment. Adequate information is provided for designing computerized reliability database system to support the application of the techniques by designers. Pedantic terms and the associated mathematics of reliability engineering discipline are excluded for the benefit of comprehensiveness and practical applications. This book offers excellent support for electrical and electronics engineering students and professionals, bridging academic curriculum with industrial expectations.

Author : Bhargava, Cherry
Publisher : IGI Global
ISBN 13 : 1799814661
Total Pages : 330 pages
Book Rating : 4.65/5 ( download)

DOWNLOAD NOW!

Download or read book AI Techniques for Reliability Prediction for Electronic Components written by Bhargava, Cherry and published by IGI Global. This book was released on 2019-12-06 with total page 330 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the industry of manufacturing and design, one major constraint has been enhancing operating performance using less time. As technology continues to advance, manufacturers are looking for better methods in predicting the condition and residual lifetime of electronic devices in order to save repair costs and their reputation. Intelligent systems are a solution for predicting the reliability of these components; however, there is a lack of research on the advancements of this smart technology within the manufacturing industry. AI Techniques for Reliability Prediction for Electronic Components provides emerging research exploring the theoretical and practical aspects of prediction methods using artificial intelligence and machine learning in the manufacturing field. Featuring coverage on a broad range of topics such as data collection, fault tolerance, and health prognostics, this book is ideally designed for reliability engineers, electronic engineers, researchers, scientists, students, and faculty members seeking current research on the advancement of reliability analysis using AI.

Author : Marius Bazu
Publisher : John Wiley & Sons
ISBN 13 : 1119990009
Total Pages : 372 pages
Book Rating : 4.00/5 ( download)

DOWNLOAD NOW!

Download or read book Failure Analysis written by Marius Bazu and published by John Wiley & Sons. This book was released on 2011-03-08 with total page 372 pages. Available in PDF, EPUB and Kindle. Book excerpt: Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers need practical orientation around the complex procedures involved in failure analysis. This guide acts as a tool for all advanced techniques, their benefits and vital aspects of their use in a reliability programme. Using twelve complex case studies, the authors explain why failure analysis should be used with electronic components, when implementation is appropriate and methods for its successful use. Inside you will find detailed coverage on: a synergistic approach to failure modes and mechanisms, along with reliability physics and the failure analysis of materials, emphasizing the vital importance of cooperation between a product development team involved the reasons why failure analysis is an important tool for improving yield and reliability by corrective actions the design stage, highlighting the ‘concurrent engineering' approach and DfR (Design for Reliability) failure analysis during fabrication, covering reliability monitoring, process monitors and package reliability reliability resting after fabrication, including reliability assessment at this stage and corrective actions a large variety of methods, such as electrical methods, thermal methods, optical methods, electron microscopy, mechanical methods, X-Ray methods, spectroscopic, acoustical, and laser methods new challenges in reliability testing, such as its use in microsystems and nanostructures This practical yet comprehensive reference is useful for manufacturers and engineers involved in the design, fabrication and testing of electronic components, devices, ICs and electronic systems, as well as for users of components in complex systems wanting to discover the roots of the reliability flaws for their products.

Author : Poong-Hyun Seong
Publisher : Springer Science & Business Media
ISBN 13 : 1848003838
Total Pages : 315 pages
Book Rating : 4.35/5 ( download)

DOWNLOAD NOW!

Download or read book Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systems written by Poong-Hyun Seong and published by Springer Science & Business Media. This book was released on 2008-11-25 with total page 315 pages. Available in PDF, EPUB and Kindle. Book excerpt: “Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systems” provides a comprehensive coverage of reliability issues and their corresponding countermeasures in the field of large-scale digital control systems, from the hardware and software in digital systems to the human operators who supervise the overall process of large-scale systems. Unlike other books which examine theories and issues in individual fields, this book reviews important problems and countermeasures across the fields of software reliability, software verification and validation, digital systems, human factors engineering and human reliability analysis. Divided into four sections dealing with software reliability, digital system reliability, human reliability and human operators in large-scale digital systems, the book offers insights from professional researchers in each specialized field in a diverse yet unified approach.

Author : Finn Jensen
Publisher : John Wiley & Sons
ISBN 13 :
Total Pages : 386 pages
Book Rating : 4.55/5 ( download)

DOWNLOAD NOW!

Download or read book Electronic Component Reliability written by Finn Jensen and published by John Wiley & Sons. This book was released on 1995 with total page 386 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book includes an introduction to some important reliability concepts and a review of terminology. The work is divided into three sections: modelling, evaluation and assurance.

Author : Giulio Di Giacomo
Publisher : McGraw-Hill Professional Publishing
ISBN 13 : 9780070170247
Total Pages : 0 pages
Book Rating : 4.4X/5 ( download)

DOWNLOAD NOW!

Download or read book Reliability of Electronic Packages and Semiconductor Devices written by Giulio Di Giacomo and published by McGraw-Hill Professional Publishing. This book was released on 1997 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text looks at predicting and extending the functional life of semiconductor components. Using empirical modelling, the author covers major types of failure mechanisms that can greatly reduce the active life of semiconductor components, including interconnection fatigue and electromigration.