Process Variations And Probabilistic Integrated Circuit Design

Author : Manfred Dietrich
Publisher : Springer Science & Business Media
ISBN 13 : 1441966218
Total Pages : 261 pages
Book Rating : 4.16/5 ( download)

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Download or read book Process Variations and Probabilistic Integrated Circuit Design written by Manfred Dietrich and published by Springer Science & Business Media. This book was released on 2011-11-20 with total page 261 pages. Available in PDF, EPUB and Kindle. Book excerpt: Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.

Author : Victor Champac
Publisher : Springer
ISBN 13 : 3319754653
Total Pages : 185 pages
Book Rating : 4.59/5 ( download)

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Download or read book Timing Performance of Nanometer Digital Circuits Under Process Variations written by Victor Champac and published by Springer. This book was released on 2018-04-18 with total page 185 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in comprehensively, without overwhelming use of analytical formulations. Emphasis is placed on providing digital designers with understanding of the sources of process variations, their impact on circuit performance and tools for improving their designs to comply with product specifications. Various circuit-level “design hints” are highlighted, so that readers can use then to improve their designs. A special treatment is devoted to unique design issues and the impact of process variations on the performance of FinFET based circuits. This book enables readers to make optimal decisions at design time, toward more efficient circuits, with better yield and higher reliability.

Author : Amith Singhee
Publisher : Springer Science & Business Media
ISBN 13 : 1441966064
Total Pages : 254 pages
Book Rating : 4.63/5 ( download)

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Download or read book Extreme Statistics in Nanoscale Memory Design written by Amith Singhee and published by Springer Science & Business Media. This book was released on 2010-09-09 with total page 254 pages. Available in PDF, EPUB and Kindle. Book excerpt: Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes useless, since its predictions will be far from the reality of manufactured ICs. On the other hand, using design margins based on some traditional notion of worst-case scenarios can force us to sacri?ce too much in terms of power consumption or manufacturing cost, to the extent of making the design goals even infeasible. We absolutely need to explicitly account for the statistics of this random variability, to have design margins that are accurate so that we can ?nd the optimum balance between yield loss and design cost. This discontinuity in design processes has led many researchers to develop effective methods of statistical design, where the designer can simulate not just the behavior of the nominal design, but the expected statistics of the behavior in manufactured ICs. Memory circuits tend to be the hardest hit by the problem of these random variations because of their high replication count on any single chip, which demands a very high statistical quality from the product. Requirements of 5–6s (0.

Author : Vasilis F. Pavlidis
Publisher : Newnes
ISBN 13 : 0124104843
Total Pages : 768 pages
Book Rating : 4.46/5 ( download)

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Download or read book Three-Dimensional Integrated Circuit Design written by Vasilis F. Pavlidis and published by Newnes. This book was released on 2017-07-04 with total page 768 pages. Available in PDF, EPUB and Kindle. Book excerpt: Three-Dimensional Integrated Circuit Design, Second Eition, expands the original with more than twice as much new content, adding the latest developments in circuit models, temperature considerations, power management, memory issues, and heterogeneous integration. 3-D IC experts Pavlidis, Savidis, and Friedman cover the full product development cycle throughout the book, emphasizing not only physical design, but also algorithms and system-level considerations to increase speed while conserving energy. A handy, comprehensive reference or a practical design guide, this book provides effective solutions to specific challenging problems concerning the design of three-dimensional integrated circuits. Expanded with new chapters and updates throughout based on the latest research in 3-D integration: Manufacturing techniques for 3-D ICs with TSVs Electrical modeling and closed-form expressions of through silicon vias Substrate noise coupling in heterogeneous 3-D ICs Design of 3-D ICs with inductive links Synchronization in 3-D ICs Variation effects on 3-D ICs Correlation of WID variations for intra-tier buffers and wires Offers practical guidance on designing 3-D heterogeneous systems Provides power delivery of 3-D ICs Demonstrates the use of 3-D ICs within heterogeneous systems that include a variety of materials, devices, processors, GPU-CPU integration, and more Provides experimental case studies in power delivery, synchronization, and thermal characterization

Author : Trent McConaghy
Publisher : Springer Science & Business Media
ISBN 13 : 146142268X
Total Pages : 198 pages
Book Rating : 4.86/5 ( download)

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Download or read book Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide written by Trent McConaghy and published by Springer Science & Business Media. This book was released on 2012-09-28 with total page 198 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects. It teaches them the state-of-the-art in Variation-Aware Design tools, which help the designer to analyze quickly the variation effects, identify the problems, and fix the problems. Furthermore, this book describes the algorithms and algorithm behavior/performance/limitations, which is of use to designers considering these tools, designers using these tools, CAD researchers, and CAD managers.

Author : Marvin Onabajo
Publisher : Springer Science & Business Media
ISBN 13 : 1461422957
Total Pages : 183 pages
Book Rating : 4.52/5 ( download)

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Download or read book Analog Circuit Design for Process Variation-Resilient Systems-on-a-Chip written by Marvin Onabajo and published by Springer Science & Business Media. This book was released on 2012-03-08 with total page 183 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements. Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters; Includes built-in testing techniques, linked to current industrial trends; Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches; Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.

Author : Siddharth Garg
Publisher :
ISBN 13 : 9781601986597
Total Pages : 75 pages
Book Rating : 4.99/5 ( download)

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Download or read book Addressing Process Variations at the Microarchitecture and System Level written by Siddharth Garg and published by . This book was released on 2013 with total page 75 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author : Martin Wirnshofer
Publisher : Springer Science & Business Media
ISBN 13 : 9400761961
Total Pages : 91 pages
Book Rating : 4.64/5 ( download)

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Download or read book Variation-Aware Adaptive Voltage Scaling for Digital CMOS Circuits written by Martin Wirnshofer and published by Springer Science & Business Media. This book was released on 2013-02-15 with total page 91 pages. Available in PDF, EPUB and Kindle. Book excerpt: Increasing performance demands in integrated circuits, together with limited energy budgets, force IC designers to find new ways of saving power. One innovative way is the presented adaptive voltage scaling scheme, which tunes the supply voltage according to the present process, voltage and temperature variations as well as aging. The voltage is adapted “on the fly” by means of in-situ delay monitors to exploit unused timing margin, produced by state-of-the-art worst-case designs. This book discusses the design of the enhanced in-situ delay monitors and the implementation of the complete control-loop comprising the monitors, a control-logic and an on-chip voltage regulator. An analytical Markov-based model of the control-loop is derived to analyze its robustness and stability. Variation-Aware Adaptive Voltage Scaling for Digital CMOS Circuits provides an in-depth assessment of the proposed voltage scaling scheme when applied to an arithmetic and an image processing circuit. This book is written for engineers interested in adaptive techniques for low-power CMOS circuits.

Author : José Monteiro
Publisher : Springer
ISBN 13 : 364211802X
Total Pages : 380 pages
Book Rating : 4.29/5 ( download)

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Download or read book Integrated Circuit and System Design: Power and Timing Modeling, Optimization and Simulation written by José Monteiro and published by Springer. This book was released on 2010-02-06 with total page 380 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the thoroughly refereed post-conference proceedings of 19th International Workshop on Power and Timing Modeling, Optimization and Simulation, PATMOS 2009, featuring Integrated Circuit and System Design, held in Delft, The Netherlands during September 9-11, 2009. The 26 revised full papers and 10 revised poster papers presented were carefully reviewed and selected from numerous submissions. The papers are organized in topical sections on variability & statistical timing, circuit level techniques, power management, low power circuits & technology, system level techniques, power & timing optimization techniques, self-timed circuits, low power circuit analysis & optimization, and low power design studies.

Author : Jian Cheng Zhang
Publisher : Springer Science & Business Media
ISBN 13 : 1461522250
Total Pages : 244 pages
Book Rating : 4.56/5 ( download)

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Download or read book Yield and Variability Optimization of Integrated Circuits written by Jian Cheng Zhang and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 244 pages. Available in PDF, EPUB and Kindle. Book excerpt: Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications. In reality, however, due to the disturbances ofthe IC manufacturing process, the actual performancesof the mass produced chips are different than those for the nominal design. Even if the manufacturing process were tightly controlled, so that there were little variations across the chips manufactured, the environmentalchanges (e. g. those oftemperature, supply voltages, etc. ) would alsomakethe circuit performances vary during the circuit life span. Process-related performance variations may lead to low manufacturing yield, and unacceptable product quality. For these reasons, statistical circuit design techniques are required to design the circuit parameters, taking the statistical process variations into account. This book deals with some theoretical and practical aspects of IC statistical design, and emphasizes how they differ from those for discrete circuits. It de scribes a spectrum of different statistical design problems, such as parametric yield optimization, generalized on-target design, variability minimization, per formance tunning, and worst-case design. The main emphasis of the presen tation is placed on the principles and practical solutions for performance vari ability minimization. It is hoped that the book may serve as an introductory reference material for various groups of IC designers, and the methodologies described will help them enhance the circuit quality and manufacturability. The book containsseven chapters.