Nanometrology Using The Transmission Electron Microscope

Author : Vlad Stolojan
Publisher : Morgan & Claypool Publishers
ISBN 13 : 1681741202
Total Pages : 69 pages
Book Rating : 4.08/5 ( download)

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Download or read book Nanometrology Using the Transmission Electron Microscope written by Vlad Stolojan and published by Morgan & Claypool Publishers. This book was released on 2015-10-12 with total page 69 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.

Author : Renu Sharma
Publisher : John Wiley & Sons
ISBN 13 : 3527347984
Total Pages : 389 pages
Book Rating : 4.88/5 ( download)

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Download or read book In-Situ Transmission Electron Microscopy Experiments written by Renu Sharma and published by John Wiley & Sons. This book was released on 2023-05-15 with total page 389 pages. Available in PDF, EPUB and Kindle. Book excerpt: In-Situ Transmission Electron Microscopy Experiments Design and execute cutting-edge experiments with transmission electron microscopy using this essential guide In-situ microscopy is a recently-discovered and rapidly-developing approach to transmission electron microscopy (TEM) that allows for the study of atomic and/or molecular changes and processes while they are in progress. Experimental specimens are subjected to stimuli that replicate near real-world conditions and their effects are observed at a previously unprecedented scale. Though in-situ microscopy is becoming an increasingly important approach to TEM, there are no current texts combining an up-to-date overview of this cutting-edge set of techniques with the experience of in-situ TEM professionals. In-Situ Transmission Electron Microscopy Experiments meets this need with a work that synthesizes the collective experience of myriad collaborators. It constitutes a comprehensive guide for planning and performing in-situ TEM measurements, incorporating both fundamental principles and novel techniques. Its combination of technical detail and practical how-to advice makes it an indispensable introduction to this area of research. In-Situ Transmission Electron Microscopy Experiments readers will also find: Coverage of the entire experimental process, from method selection to experiment design to measurement and data analysis Detailed treatment of multimodal and correlative microscopy, data processing and machine learning, and more Discussion of future challenges and opportunities facing this field of research In-Situ Transmission Electron Microscopy Experiments is essential for graduate students, post-doctoral fellows, and early career researchers entering the field of in-situ TEM.

Author : David C. Cox
Publisher : Morgan & Claypool Publishers
ISBN 13 : 1681741482
Total Pages : 119 pages
Book Rating : 4.82/5 ( download)

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Download or read book Introduction to Focused Ion Beam Nanometrology written by David C. Cox and published by Morgan & Claypool Publishers. This book was released on 2015-10-01 with total page 119 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology. Beginning with a description of the currently available instruments including the new addition to the field of plasma-based sources, it then gives an overview of ion solid interactions and how the different types of instrument can be applied. Chapters then describe how these machines can be applied to the field of materials science and device fabrication giving examples of recent and current activity in both these areas.

Author : Khan Maaz
Publisher : BoD – Books on Demand
ISBN 13 : 9535121502
Total Pages : 362 pages
Book Rating : 4.03/5 ( download)

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Download or read book The Transmission Electron Microscope written by Khan Maaz and published by BoD – Books on Demand. This book was released on 2015-09-02 with total page 362 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book The Transmission Electron Microscope abundantly illustrates necessary insight and guidance of this powerful and versatile material characterization technique with complete figures and thorough explanations. The second edition of the book presents deep understanding of new techniques from introduction to advance levels, covering in-situ transmission electron microscopy, electron and focused ion beam microscopy, and biological diagnostic through TEM. The chapters cover all major aspects of transmission electron microscopy and their uses in material characterization with special emphasis on both the theoretical and experimental aspects of modern electron microscopy techniques. It is believed that this book will provide a solid foundation of electron microscopy to the students, scientists, and engineers working in the field of material science and condensed matter physics.

Author : Khan Maaz
Publisher : BoD – Books on Demand
ISBN 13 : 9535104500
Total Pages : 396 pages
Book Rating : 4.06/5 ( download)

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Download or read book The Transmission Electron Microscope written by Khan Maaz and published by BoD – Books on Demand. This book was released on 2012-04-04 with total page 396 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book "The Transmission Electron Microscope" contains a collection of research articles submitted by engineers and scientists to present an overview of different aspects of TEM from the basic mechanisms and diagnosis to the latest advancements in the field. The book presents descriptions of electron microscopy, models for improved sample sizing and handling, new methods of image projection, and experimental methodologies for nanomaterials studies. The selection of chapters focuses on transmission electron microscopy used in material characterization, with special emphasis on both the theoretical and experimental aspect of modern electron microscopy techniques. I believe that a broad range of readers, such as students, scientists and engineers will benefit from this book.

Author : Petr Klapetek
Publisher : William Andrew
ISBN 13 : 1455730599
Total Pages : 335 pages
Book Rating : 4.99/5 ( download)

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Download or read book Quantitative Data Processing in Scanning Probe Microscopy written by Petr Klapetek and published by William Andrew. This book was released on 2012-12-31 with total page 335 pages. Available in PDF, EPUB and Kindle. Book excerpt: Accurate measurement at the nano-scale – nanometrology – is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM). Despite tremendous advances in Scanning Probe Microscopy (SPM) over the last twenty years, its potential as a quantitative measurement tool have not been fully realized, due to challenges such as the complexity of tip/sample interaction. In this book, Petr Klapetek uses the latest research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics, and life sciences. Klapetek's considerable experience of Quantitive Data Processing, using software tools, enables him to not only explain the microscopy techniques, but also to demystify the analysis and interpretation of the data collected. In addition to the essential principles and theory of SPM metrology, Klapetek provides readers with a number of worked examples to demonstrate typical ways of solving problems in SPM analysis. Source data for the examples as well as most of the described open source software tools are available on a companion website. Unlocks the use of Scanning Probe Microscopy (SPM) for nanometrology applications in engineering, physics, life science and earth science settings Provides practical guidance regarding areas of difficulty such as tip/sample interaction and calibration – making metrology applications achievable Gives guidance on data collection and interpretation, including the use of software-based modeling (using applications that are mostly freely available)

Author : Julia Deneen Nowak
Publisher :
ISBN 13 :
Total Pages : 510 pages
Book Rating : 4.60/5 ( download)

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Download or read book Characterization of Surfaces and Interfaces in Nanoparticles Using Transmission Electron Microscopy written by Julia Deneen Nowak and published by . This book was released on 2007 with total page 510 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author : Elisabeth Mansfield
Publisher : John Wiley & Sons
ISBN 13 : 3527800050
Total Pages : 626 pages
Book Rating : 4.56/5 ( download)

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Download or read book Metrology and Standardization for Nanotechnology written by Elisabeth Mansfield and published by John Wiley & Sons. This book was released on 2017-01-20 with total page 626 pages. Available in PDF, EPUB and Kindle. Book excerpt: For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products. First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide a basis for the reliable and reproducible characterization of nanomaterials. The role of standards organizations are presented and finally, an overview of risk management and the commercial impact of metrology and standardization for industrial innovations.

Author : Joseph Goldstein
Publisher : Springer Science & Business Media
ISBN 13 : 1461344220
Total Pages : 598 pages
Book Rating : 4.23/5 ( download)

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Download or read book Practical Scanning Electron Microscopy written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 598 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.

Author : R. L. Griffin
Publisher : Prentice Hall
ISBN 13 :
Total Pages : 122 pages
Book Rating : 4.80/5 ( download)

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Download or read book Using the Transmission Electron Microscope in the Biological Sciences written by R. L. Griffin and published by Prentice Hall. This book was released on 1990 with total page 122 pages. Available in PDF, EPUB and Kindle. Book excerpt: