Introduction to X-Ray Powder Diffractometry

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Author :
Publisher : Wiley-Interscience
ISBN 13 :
Total Pages : 440 pages
Book Rating : 4.68/5 ( download)

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Book Synopsis Introduction to X-Ray Powder Diffractometry by : Ron Jenkins

Download or read book Introduction to X-Ray Powder Diffractometry written by Ron Jenkins and published by Wiley-Interscience. This book was released on 1996-07-12 with total page 440 pages. Available in PDF, EPUB and Kindle. Book excerpt: When bombarded with X-rays, solid materials produce distinct scattering patterns similar to fingerprints. X-ray powder diffraction is a technique used to fingerprint solid samples, which are then identified and cataloged for future use-much the way the FBI keeps fingerprints on file. The current database of some 70,000 material prints has been put to a broad range of uses, from the analysis of moon rocks to testing drugs for purity. Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation of the state-of-the-art techniques involved in characterizing materials. It covers the latest instruments and methods, with an emphasis on the fundamentals of the diffractometer, its components, alignment, calibration, and automation. The first three chapters outline diffraction theory in clear language, accessible to both students and professionals in chemistry, physics, geology, and materials science. The book's middle chapters describe the instrumentation and procedures used in X-ray diffraction, including X-ray sources, X-ray detection, and production of monochromatic radiation. The chapter devoted to instrument design and calibration is followed by an examination of specimen preparation methods, data collection, and reduction. The final two chapters provide in-depth discussions of qualitative and quantitative analysis. While the material is presented in an orderly progression, beginning with basic concepts and moving on to more complex material, each chapter stands on its own and can be studied independently or used as a professional reference. More than 230 illustrations and tables demonstrate techniques and clarify complex material. Self-contained, timely, and user-friendly, Introduction to X-ray Powder Diffractometry is an enormously useful text and professional reference for analytical chemists, physicists, geologists and materials scientists, and upper-level undergraduate and graduate students in materials science and analytical chemistry. X-ray powder diffraction-a technique that has matured significantly in recent years-is used to identify solid samples and determine their composition by analyzing the so-called "fingerprints" they generate when X-rayed. This unique volume fulfills two major roles: it is the first textbook devoted solely to X-ray powder diffractometry, and the first up-to-date treatment of the subject in 20 years. This timely, authoritative volume features: * Clear, concise descriptions of both theory and practice-including fundamentals of diffraction theory and all aspects of the diffractometer * A treatment that reflects current trends toward automation, covering the newest instrumentation and automation techniques * Coverage of all the most common applications, with special emphasis on qualitative and quantitative analysis * An accessible presentation appropriate for both students and professionals * More than 230 tables and illustrations Introduction to X-ray Powder Diffractometry, a collaboration between two internationally known and respected experts in the field, provides invaluable guidance to anyone using X-ray powder diffractometers and diffractometry in materials science, ceramics, the pharmaceutical industry, and elsewhere.

Introduction to X-Ray Powder Diffractometry

Download Introduction to X-Ray Powder Diffractometry PDF Online Free

Author :
Publisher : Wiley-Interscience
ISBN 13 :
Total Pages : 440 pages
Book Rating : 4.68/5 ( download)

DOWNLOAD NOW!


Book Synopsis Introduction to X-Ray Powder Diffractometry by : Ron Jenkins

Download or read book Introduction to X-Ray Powder Diffractometry written by Ron Jenkins and published by Wiley-Interscience. This book was released on 1996-07-12 with total page 440 pages. Available in PDF, EPUB and Kindle. Book excerpt: When bombarded with X-rays, solid materials produce distinct scattering patterns similar to fingerprints. X-ray powder diffraction is a technique used to fingerprint solid samples, which are then identified and cataloged for future use-much the way the FBI keeps fingerprints on file. The current database of some 70,000 material prints has been put to a broad range of uses, from the analysis of moon rocks to testing drugs for purity. Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation of the state-of-the-art techniques involved in characterizing materials. It covers the latest instruments and methods, with an emphasis on the fundamentals of the diffractometer, its components, alignment, calibration, and automation. The first three chapters outline diffraction theory in clear language, accessible to both students and professionals in chemistry, physics, geology, and materials science. The book's middle chapters describe the instrumentation and procedures used in X-ray diffraction, including X-ray sources, X-ray detection, and production of monochromatic radiation. The chapter devoted to instrument design and calibration is followed by an examination of specimen preparation methods, data collection, and reduction. The final two chapters provide in-depth discussions of qualitative and quantitative analysis. While the material is presented in an orderly progression, beginning with basic concepts and moving on to more complex material, each chapter stands on its own and can be studied independently or used as a professional reference. More than 230 illustrations and tables demonstrate techniques and clarify complex material. Self-contained, timely, and user-friendly, Introduction to X-ray Powder Diffractometry is an enormously useful text and professional reference for analytical chemists, physicists, geologists and materials scientists, and upper-level undergraduate and graduate students in materials science and analytical chemistry. X-ray powder diffraction-a technique that has matured significantly in recent years-is used to identify solid samples and determine their composition by analyzing the so-called "fingerprints" they generate when X-rayed. This unique volume fulfills two major roles: it is the first textbook devoted solely to X-ray powder diffractometry, and the first up-to-date treatment of the subject in 20 years. This timely, authoritative volume features: * Clear, concise descriptions of both theory and practice-including fundamentals of diffraction theory and all aspects of the diffractometer * A treatment that reflects current trends toward automation, covering the newest instrumentation and automation techniques * Coverage of all the most common applications, with special emphasis on qualitative and quantitative analysis * An accessible presentation appropriate for both students and professionals * More than 230 tables and illustrations Introduction to X-ray Powder Diffractometry, a collaboration between two internationally known and respected experts in the field, provides invaluable guidance to anyone using X-ray powder diffractometers and diffractometry in materials science, ceramics, the pharmaceutical industry, and elsewhere.

Introduction to X-Ray Powder Diffractometry

Download Introduction to X-Ray Powder Diffractometry PDF Online Free

Author :
Publisher : Wiley-Interscience
ISBN 13 :
Total Pages : 440 pages
Book Rating : 4.68/5 ( download)

DOWNLOAD NOW!


Book Synopsis Introduction to X-Ray Powder Diffractometry by : Ron Jenkins

Download or read book Introduction to X-Ray Powder Diffractometry written by Ron Jenkins and published by Wiley-Interscience. This book was released on 1996-07-12 with total page 440 pages. Available in PDF, EPUB and Kindle. Book excerpt: When bombarded with X-rays, solid materials produce distinct scattering patterns similar to fingerprints. X-ray powder diffraction is a technique used to fingerprint solid samples, which are then identified and cataloged for future use-much the way the FBI keeps fingerprints on file. The current database of some 70,000 material prints has been put to a broad range of uses, from the analysis of moon rocks to testing drugs for purity. Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation of the state-of-the-art techniques involved in characterizing materials. It covers the latest instruments and methods, with an emphasis on the fundamentals of the diffractometer, its components, alignment, calibration, and automation. The first three chapters outline diffraction theory in clear language, accessible to both students and professionals in chemistry, physics, geology, and materials science. The book's middle chapters describe the instrumentation and procedures used in X-ray diffraction, including X-ray sources, X-ray detection, and production of monochromatic radiation. The chapter devoted to instrument design and calibration is followed by an examination of specimen preparation methods, data collection, and reduction. The final two chapters provide in-depth discussions of qualitative and quantitative analysis. While the material is presented in an orderly progression, beginning with basic concepts and moving on to more complex material, each chapter stands on its own and can be studied independently or used as a professional reference. More than 230 illustrations and tables demonstrate techniques and clarify complex material. Self-contained, timely, and user-friendly, Introduction to X-ray Powder Diffractometry is an enormously useful text and professional reference for analytical chemists, physicists, geologists and materials scientists, and upper-level undergraduate and graduate students in materials science and analytical chemistry. X-ray powder diffraction-a technique that has matured significantly in recent years-is used to identify solid samples and determine their composition by analyzing the so-called "fingerprints" they generate when X-rayed. This unique volume fulfills two major roles: it is the first textbook devoted solely to X-ray powder diffractometry, and the first up-to-date treatment of the subject in 20 years. This timely, authoritative volume features: * Clear, concise descriptions of both theory and practice-including fundamentals of diffraction theory and all aspects of the diffractometer * A treatment that reflects current trends toward automation, covering the newest instrumentation and automation techniques * Coverage of all the most common applications, with special emphasis on qualitative and quantitative analysis * An accessible presentation appropriate for both students and professionals * More than 230 tables and illustrations Introduction to X-ray Powder Diffractometry, a collaboration between two internationally known and respected experts in the field, provides invaluable guidance to anyone using X-ray powder diffractometers and diffractometry in materials science, ceramics, the pharmaceutical industry, and elsewhere.

X-Ray Diffraction

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 1489901485
Total Pages : 275 pages
Book Rating : 4.84/5 ( download)

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Book Synopsis X-Ray Diffraction by : C. Suryanarayana

Download or read book X-Ray Diffraction written by C. Suryanarayana and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 275 pages. Available in PDF, EPUB and Kindle. Book excerpt: In this, the only book available to combine both theoretical and practical aspects of x-ray diffraction, the authors emphasize a "hands on" approach through experiments and examples based on actual laboratory data. Part I presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information. In Part II, eight experimental modules enable the students to gain an appreciation for what information can be obtained by x-ray diffraction and how to interpret it. Examples from all classes of materials -- metals, ceramics, semiconductors, and polymers -- are included. Diffraction patterns and Bragg angles are provided for students without diffractometers. 192 illustrations.

Fundamentals of Powder Diffraction and Structural Characterization of Materials, Second Edition

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 0387095799
Total Pages : 751 pages
Book Rating : 4.90/5 ( download)

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Book Synopsis Fundamentals of Powder Diffraction and Structural Characterization of Materials, Second Edition by : Vitalij Pecharsky

Download or read book Fundamentals of Powder Diffraction and Structural Characterization of Materials, Second Edition written by Vitalij Pecharsky and published by Springer Science & Business Media. This book was released on 2008-11-24 with total page 751 pages. Available in PDF, EPUB and Kindle. Book excerpt: A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction. This prompted a revision, which had to be beyond cosmetic limits. The book was, and remains focused on standard laboratory powder diffractometry. It is still meant to be used as a text for teaching students about the capabilities and limitations of the powder diffraction method. We also hope that it goes beyond a simple text, and therefore, is useful as a reference to practitioners of the technique. The original book had seven long chapters that may have made its use as a text - convenient. So the second edition is broken down into 25 shorter chapters. The ?rst ?fteen are concerned with the fundamentals of powder diffraction, which makes it much more logical, considering a typical 16-week long semester. The last ten ch- ters are concerned with practical examples of structure solution and re?nement, which were preserved from the ?rst edition and expanded by another example – R solving the crystal structure of Tylenol .

X-Ray Diffraction Crystallography

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 3642166350
Total Pages : 320 pages
Book Rating : 4.58/5 ( download)

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Book Synopsis X-Ray Diffraction Crystallography by : Yoshio Waseda

Download or read book X-Ray Diffraction Crystallography written by Yoshio Waseda and published by Springer Science & Business Media. This book was released on 2011-03-18 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.

Theory of XRF : getting acquainted with the principles

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Author :
Publisher :
ISBN 13 : 9789090167589
Total Pages : 71 pages
Book Rating : 4.87/5 ( download)

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Book Synopsis Theory of XRF : getting acquainted with the principles by : Peter Brouwer

Download or read book Theory of XRF : getting acquainted with the principles written by Peter Brouwer and published by . This book was released on 2006 with total page 71 pages. Available in PDF, EPUB and Kindle. Book excerpt:

X-Ray Diffraction for Materials Research

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Author :
Publisher : CRC Press
ISBN 13 : 1315361973
Total Pages : 302 pages
Book Rating : 4.70/5 ( download)

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Book Synopsis X-Ray Diffraction for Materials Research by : Myeongkyu Lee

Download or read book X-Ray Diffraction for Materials Research written by Myeongkyu Lee and published by CRC Press. This book was released on 2017-03-16 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.

Structure Determination from Powder Diffraction Data

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Author :
Publisher : OUP Oxford
ISBN 13 : 0198500912
Total Pages : 358 pages
Book Rating : 4.19/5 ( download)

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Book Synopsis Structure Determination from Powder Diffraction Data by : William I. F. David

Download or read book Structure Determination from Powder Diffraction Data written by William I. F. David and published by OUP Oxford. This book was released on 2002 with total page 358 pages. Available in PDF, EPUB and Kindle. Book excerpt: Our understanding of the properties of materials, from drugs and proteins to catalysts and ceramics, is almost always based on structural information. This book describes the new developments in the realm of powder diffraction which make it possible for scientists to obtain such information even from polycrystalline materials. Written and edited by experts active in the field, and covering both the fundamental and applied aspects of structure solution from powder diffraction data, this book guides both novices and experienced practitioners alike through the maze of possibilities.

An Introduction to X-ray Crystallography

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Author :
Publisher : Cambridge University Press
ISBN 13 : 9780521423595
Total Pages : 422 pages
Book Rating : 4.97/5 ( download)

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Book Synopsis An Introduction to X-ray Crystallography by : Michael M. Woolfson

Download or read book An Introduction to X-ray Crystallography written by Michael M. Woolfson and published by Cambridge University Press. This book was released on 1997-01-13 with total page 422 pages. Available in PDF, EPUB and Kindle. Book excerpt: A textbook for the student beginning a serious study of X-ray crystallography.