Fundamentals Of An Atomic Force Microscope Based On A Digital Versatile Disk Optical Pick Up Unit

Author : En-Te Hwu
Publisher : Edwin Hwu
ISBN 13 :
Total Pages : 136 pages
Book Rating : 4./5 ( download)

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Download or read book Fundamentals of an Atomic Force Microscope Based on a Digital Versatile Disk Optical Pick-up Unit written by En-Te Hwu and published by Edwin Hwu. This book was released on 2014-04-30 with total page 136 pages. Available in PDF, EPUB and Kindle. Book excerpt: A novel non-contact multiaxial astigmatic detection system (ADS) is designed and developed using the astigmatism as the measuring principle for the translational displacement, the angle, and their variations of a measured surface simultaneously. An optical pickup unit (OPU) of a commercial digital versatile disk (DVD) read only memory (ROM) drive can be used directly as an optical path mechanism in the above mentioned ADS, which can measure the translational and angular displacements accurately and simultaneously. The total linear detection range and the maximum measurement bandwidth of the ADS are 6 mm and 80MHz, respectively. The resolution of the translational displacement measurement is in sub-angstrom scale. For an operating frequency of 700 kHz, the noise floors of the translational and angular signals are below 0.8 pm/Hz1/2 and 0.4 mrad/ Hz1/2, respectively. The ADS can monitor the translational and two orthogonal angular displacements of a micro fabricated cantilever in atomic force microscopy (AFM). All the three, contact non-contact and tapping, modes can resolve the single atomic steps of the graphite surface, which indicates that atomic resolution is achievable with the ADS. The thermal noise spectra of the AFM probe can be clearly measured as well. Furthermore, the accuracy of scanning probe microscopy (SPM) depends not only on the measurement system itself, but also by the accuracy of the signal processing, which further depends on the physical and geometrical characteristics of the probe. The structure of the ADS is compact and stable. Besides the measurements through AFM probes, the ADS can be operated in profilometer mode. The CD surface and the CCD microlens are measured by this mode. The maximum scanning speed can reach up to 3.84×106 mm/s theoretically, almost one million times faster than that of a commercial SPM system. The ADS has a great potential for future development, the expansibility and the accuracy can evolve with the performance of future OPU. From the DVD OPU to higher resolution one, such as the OPU of the Blu-ray drive or high- definition (HD-DVD), can be integrated into the ADS as well. KEYWORDS: Astigmatism, ADS, Translational displacement, Angular displacement, SPM, AFM, Cantilever, Optical profilometer

Author : Reifenberger Ronald G
Publisher : World Scientific
ISBN 13 : 9814630373
Total Pages : 340 pages
Book Rating : 4.75/5 ( download)

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Download or read book Fundamentals Of Atomic Force Microscopy - Part I: Foundations written by Reifenberger Ronald G and published by World Scientific. This book was released on 2015-09-29 with total page 340 pages. Available in PDF, EPUB and Kindle. Book excerpt: The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to “Fundamentals of AFM”, an online video course available at https://nanohub.org/courses/AFM1/Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)

Author : Ronald G. Reifenberger
Publisher : World Scientific Publishing Company Incorporated
ISBN 13 : 9789814630351
Total Pages : 324 pages
Book Rating : 4.57/5 ( download)

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Download or read book Fundamentals of Atomic Force Microscopy written by Ronald G. Reifenberger and published by World Scientific Publishing Company Incorporated. This book was released on 2015-02 with total page 324 pages. Available in PDF, EPUB and Kindle. Book excerpt: The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM.

Author : Ronald Reifenberger
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.52/5 ( download)

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Download or read book Fundamentals of Atomic Force Microscopy written by Ronald Reifenberger and published by . This book was released on 2016 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author : S. Morita
Publisher : Springer Science & Business Media
ISBN 13 : 9783540431176
Total Pages : 468 pages
Book Rating : 4.79/5 ( download)

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Download or read book Noncontact Atomic Force Microscopy written by S. Morita and published by Springer Science & Business Media. This book was released on 2002-07-24 with total page 468 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

Author : Dror Sarid
Publisher : Oxford University Press
ISBN 13 : 0195344693
Total Pages : 285 pages
Book Rating : 4.91/5 ( download)

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Download or read book Scanning Force Microscopy written by Dror Sarid and published by Oxford University Press. This book was released on 1994-08-25 with total page 285 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.

Author : Peter Eaton
Publisher : Oxford University Press
ISBN 13 : 0199570450
Total Pages : 257 pages
Book Rating : 4.54/5 ( download)

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Download or read book Atomic Force Microscopy written by Peter Eaton and published by Oxford University Press. This book was released on 2010-03-25 with total page 257 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.

Author : Seizo Morita
Publisher : Springer Science & Business Media
ISBN 13 : 364201495X
Total Pages : 410 pages
Book Rating : 4.56/5 ( download)

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Download or read book Noncontact Atomic Force Microscopy written by Seizo Morita and published by Springer Science & Business Media. This book was released on 2009-09-18 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

Author : Victor Bellitto
Publisher : BoD – Books on Demand
ISBN 13 : 9535104144
Total Pages : 272 pages
Book Rating : 4.48/5 ( download)

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Download or read book Atomic Force Microscopy written by Victor Bellitto and published by BoD – Books on Demand. This book was released on 2012-03-23 with total page 272 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.

Author : Wesley C. Sanders
Publisher : CRC Press
ISBN 13 : 1000707946
Total Pages : 144 pages
Book Rating : 4.46/5 ( download)

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Download or read book Atomic Force Microscopy written by Wesley C. Sanders and published by CRC Press. This book was released on 2019-10-08 with total page 144 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses primarily on the atomic force microscope and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester-long introductory course in atomic force microscopy. There are a few algebra-based mathematical relationships included in the book that describe the mechanical properties, behaviors, and intermolecular forces associated with probes used in atomic force microscopy. Relevant figures, tables, and illustrations also appear in each chapter in an effort to provide additional information and points of interest. This book includes suggested laboratory investigations that provide opportunities to explore the versatility of the atomic force microscope. These laboratory exercises include opportunities for experimenters to explore force curves, surface roughness, friction loops, conductivity imaging, and phase imaging.