Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits

Author : M. Bushnell
Publisher : Springer Science & Business Media
ISBN 13 : 0306470403
Total Pages : 690 pages
Book Rating : 4.00/5 ( download)

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Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Author : M. Bushnell
Publisher : Springer Science & Business Media
ISBN 13 : 0792379918
Total Pages : 712 pages
Book Rating : 4.11/5 ( download)

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Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2004-12-15 with total page 712 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Author : Michael Lee Bushnell
Publisher :
ISBN 13 : 9781601190178
Total Pages : 690 pages
Book Rating : 4.74/5 ( download)

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Download or read book Essentials of Electronic Testing for Digital, Memory, and Mixed-signal VLSI Circuits written by Michael Lee Bushnell and published by . This book was released on 2000 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author : Laung-Terng Wang
Publisher : Elsevier
ISBN 13 : 9780080474793
Total Pages : 808 pages
Book Rating : 4.99/5 ( download)

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Download or read book VLSI Test Principles and Architectures written by Laung-Terng Wang and published by Elsevier. This book was released on 2006-08-14 with total page 808 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Author : Mark (Mohammad) Tehranipoor
Publisher : Springer
ISBN 13 : 3319118242
Total Pages : 269 pages
Book Rating : 4.46/5 ( download)

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Download or read book Counterfeit Integrated Circuits written by Mark (Mohammad) Tehranipoor and published by Springer. This book was released on 2015-02-12 with total page 269 pages. Available in PDF, EPUB and Kindle. Book excerpt: This timely and exhaustive study offers a much-needed examination of the scope and consequences of the electronic counterfeit trade. The authors describe a variety of shortcomings and vulnerabilities in the electronic component supply chain, which can result in counterfeit integrated circuits (ICs). Not only does this book provide an assessment of the current counterfeiting problems facing both the public and private sectors, it also offers practical, real-world solutions for combatting this substantial threat. · Helps beginners and practitioners in the field by providing a comprehensive background on the counterfeiting problem; · Presents innovative taxonomies for counterfeit types, test methods, and counterfeit defects, which allows for a detailed analysis of counterfeiting and its mitigation; · Provides step-by-step solutions for detecting different types of counterfeit ICs; · Offers pragmatic and practice-oriented, realistic solutions to counterfeit IC detection and avoidance, for industry and government.

Author : Laung-Terng Wang
Publisher : Morgan Kaufmann
ISBN 13 : 9780080556802
Total Pages : 896 pages
Book Rating : 4.09/5 ( download)

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Download or read book System-on-Chip Test Architectures written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2010-07-28 with total page 896 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

Author : Louis J. Gullo
Publisher : John Wiley & Sons
ISBN 13 : 1119578515
Total Pages : 400 pages
Book Rating : 4.12/5 ( download)

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Download or read book Design for Maintainability written by Louis J. Gullo and published by John Wiley & Sons. This book was released on 2021-02-23 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt: How to design for optimum maintenance capabilities and minimize the repair time Design for Maintainability offers engineers a wide range of tools and techniques for incorporating maintainability into the design process for complex systems. With contributions from noted experts on the topic, the book explains how to design for optimum maintenance capabilities while simultaneously minimizing the time to repair equipment. The book contains a wealth of examples and the most up-to-date maintainability design practices that have proven to result in better system readiness, shorter downtimes, and substantial cost savings over the entire system life cycle, thereby, decreasing the Total Cost of Ownership. Design for Maintainability offers a wealth of design practices not covered in typical engineering books, thus allowing readers to think outside the box when developing maintainability design requirements. The books principles and practices can help engineers to dramatically improve their ability to compete in global markets and gain widespread customer satisfaction. This important book: Offers a complete overview of maintainability engineering as a system engineering discipline Includes contributions from authors who are recognized leaders in the field Contains real-life design examples, both good and bad, from various industries Presents realistic illustrations of good maintainability design principles Provides discussion of the interrelationships between maintainability with other related disciplines Explores trending topics in technologies Written for design and logistics engineers and managers, Design for Maintainability is a comprehensive resource containing the most reliable and innovative techniques for improving maintainability when designing a system or product.

Author : Anant Agarwal
Publisher : Elsevier
ISBN 13 : 008050681X
Total Pages : 1008 pages
Book Rating : 4.14/5 ( download)

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Download or read book Foundations of Analog and Digital Electronic Circuits written by Anant Agarwal and published by Elsevier. This book was released on 2005-07-01 with total page 1008 pages. Available in PDF, EPUB and Kindle. Book excerpt: Unlike books currently on the market, this book attempts to satisfy two goals: combine circuits and electronics into a single, unified treatment, and establish a strong connection with the contemporary world of digital systems. It will introduce a new way of looking not only at the treatment of circuits, but also at the treatment of introductory coursework in engineering in general. Using the concept of ''abstraction,'' the book attempts to form a bridge between the world of physics and the world of large computer systems. In particular, it attempts to unify electrical engineering and computer science as the art of creating and exploiting successive abstractions to manage the complexity of building useful electrical systems. Computer systems are simply one type of electrical systems. +Balances circuits theory with practical digital electronics applications. +Illustrates concepts with real devices. +Supports the popular circuits and electronics course on the MIT OpenCourse Ware from which professionals worldwide study this new approach. +Written by two educators well known for their innovative teaching and research and their collaboration with industry. +Focuses on contemporary MOS technology.

Author : Ian A. Grout
Publisher : Springer Science & Business Media
ISBN 13 : 9781846280238
Total Pages : 396 pages
Book Rating : 4.30/5 ( download)

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Download or read book Integrated Circuit Test Engineering written by Ian A. Grout and published by Springer Science & Business Media. This book was released on 2005-08-22 with total page 396 pages. Available in PDF, EPUB and Kindle. Book excerpt: Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively

Author : Parag K. Lala
Publisher : Springer Nature
ISBN 13 : 303179785X
Total Pages : 99 pages
Book Rating : 4.59/5 ( download)

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Download or read book An Introduction to Logic Circuit Testing written by Parag K. Lala and published by Springer Nature. This book was released on 2022-06-01 with total page 99 pages. Available in PDF, EPUB and Kindle. Book excerpt: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References