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Author :
Publisher :
ISBN 13 :
Total Pages : 716 pages
Book Rating : 4.44/5 ( download)
Download or read book Electron Microscopy and Analysis written by and published by . This book was released on 1997 with total page 716 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : C. J. Kiely
Publisher : CRC Press
ISBN 13 : 9780750305778
Total Pages : 1320 pages
Book Rating : 4.70/5 ( download)
Download or read book Electron Microscopy and Analysis 1999 written by C. J. Kiely and published by CRC Press. This book was released on 1999-12-01 with total page 1320 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron Microscopy and Analysis 1999 provides an overview of recent developments and outlines opportunities for future research in electron microscopy. The book presents the wide-ranging applications of these techniques in materials science, metallurgy, and surface science. It is an authoritative reference for academics and researchers working in materials science, instrumentation, electron optics, and condensed matter physics.
Author : Peter J. Goodhew
Publisher : CRC Press
ISBN 13 : 9780748409686
Total Pages : 274 pages
Book Rating : 4.88/5 ( download)
Download or read book Electron Microscopy and Analysis, Third Edition written by Peter J. Goodhew and published by CRC Press. This book was released on 2000-11-30 with total page 274 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.
Author : Rodenburg
Publisher : CRC Press
ISBN 13 : 9780750304412
Total Pages : 708 pages
Book Rating : 4.13/5 ( download)
Download or read book Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997 written by Rodenburg and published by CRC Press. This book was released on 1997-01-01 with total page 708 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy (from P. Hawkes), the development of the scanning electron microscope at Cambridge (from K. Smith), electron energy loss spectroscopy (from L.M. Brown), imaging methods (from J. Spence), and the future of electron microscopy (from C. Humphreys). Covering a wide range of applications of advanced techniques, it discusses electron imaging, electron energy-loss and x-ray analysis, and scanning probe and electron beam microscopies. This volume is a handy reference for professionals using microscopes in all areas of physics, materials science, metallurgy, and surface science to gain an overview of developments in our understanding of materials microstructure and of advances in microscope interrogation techniques.
Author : Rodenburg
Publisher : CRC Press
ISBN 13 : 9780750304412
Total Pages : 716 pages
Book Rating : 4.13/5 ( download)
Download or read book Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997 written by Rodenburg and published by CRC Press. This book was released on 1997-01-01 with total page 716 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy (from P. Hawkes), the development of the scanning electron microscope at Cambridge (from K. Smith), electron energy loss spectroscopy (from L.M. Brown), imaging methods (from J. Spence), and the future of electron microscopy (from C. Humphreys). Covering a wide range of applications of advanced techniques, it discusses electron imaging, electron energy-loss and x-ray analysis, and scanning probe and electron beam microscopies. This volume is a handy reference for professionals using microscopes in all areas of physics, materials science, metallurgy, and surface science to gain an overview of developments in our understanding of materials microstructure and of advances in microscope interrogation techniques.
Author : Charles E. Lyman
Publisher : Springer Science & Business Media
ISBN 13 : 9780306435911
Total Pages : 428 pages
Book Rating : 4.18/5 ( download)
Download or read book Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy written by Charles E. Lyman and published by Springer Science & Business Media. This book was released on 1990-08-31 with total page 428 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out by formal classes in universities and colleges and by special summer courses such as the ones offered for the past 19 years at Lehigh University. Laboratory work, which should be an integral part of such courses, is often hindered by the lack of a suitable laboratory workbook. While laboratory workbooks for transmission electron microscopy have-been in existence for many years, the broad range of topics that must be dealt with in scanning electron microscopy and microanalysis has made it difficult for instructors to devise meaningful experiments. The present workbook provides a series of fundamental experiments to aid in "hands-on" learning of the use of the instrumentation and the techniques. It is written by a group of eminently qualified scientists and educators. The importance of hands-on learning cannot be overemphasized.
Author : John J. Bozzola
Publisher : Jones & Bartlett Learning
ISBN 13 : 9780763701925
Total Pages : 702 pages
Book Rating : 4.20/5 ( download)
Download or read book Electron Microscopy written by John J. Bozzola and published by Jones & Bartlett Learning. This book was released on 1999 with total page 702 pages. Available in PDF, EPUB and Kindle. Book excerpt: New edition of an introductory reference that covers all of the important aspects of electron microscopy from a biological perspective, including theory of scanning and transmission; specimen preparation; darkroom, digital imaging, and image analysis; laboratory safety; interpretation of images; and an atlas of ultrastructure. Generously illustrated with bandw line drawings and photographs. Annotation copyrighted by Book News, Inc., Portland, OR
Author : Patrick Echlin
Publisher : Springer Science & Business Media
ISBN 13 : 0387857311
Total Pages : 329 pages
Book Rating : 4.12/5 ( download)
Download or read book Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis written by Patrick Echlin and published by Springer Science & Business Media. This book was released on 2011-04-14 with total page 329 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Author : Peter John Goodhew
Publisher :
ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.75/5 ( download)
Download or read book Electron microscopy and analysis written by Peter John Goodhew and published by . This book was released on 1988 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : A.G Cullis
Publisher : CRC Press
ISBN 13 : 9780750306508
Total Pages : 782 pages
Book Rating : 4.05/5 ( download)
Download or read book Microscopy of Semiconducting Materials written by A.G Cullis and published by CRC Press. This book was released on 2000-01-01 with total page 782 pages. Available in PDF, EPUB and Kindle. Book excerpt: With IC technology continuing to advance, the analysis of very small structures remains critically important. Microscopy of Semiconducting Materials provides an overview of advances in semiconductor studies using microscopy. The book explores the use of transmission and scanning electron microscopy, ultrafine electron probes, and EELS to investigate semiconducting structures. It also covers specimen preparation using focused ion beam milling and advances in microscopy techniques using different types of scanning probes, such as AFM, STM, and SCM. In addition, the book discusses a range of materials, from finished devices to partly processed materials and structures, including nanoscale wires and dots. This volume provides an authoritative reference for all academics and researchers in materials science, electrical and electronic engineering and instrumentation, and condensed matter physics.
