Circuit Design For Reliability

Author : Ricardo Reis
Publisher : Springer
ISBN 13 : 1461440785
Total Pages : 271 pages
Book Rating : 4.89/5 ( download)

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Download or read book Circuit Design for Reliability written by Ricardo Reis and published by Springer. This book was released on 2014-11-08 with total page 271 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

Author : Jiann-Shiun Yuan
Publisher : Springer
ISBN 13 : 9811008841
Total Pages : 106 pages
Book Rating : 4.49/5 ( download)

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Download or read book CMOS RF Circuit Design for Reliability and Variability written by Jiann-Shiun Yuan and published by Springer. This book was released on 2016-04-13 with total page 106 pages. Available in PDF, EPUB and Kindle. Book excerpt: The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.

Author : Eugene R. Hnatek
Publisher :
ISBN 13 :
Total Pages : 736 pages
Book Rating : 4.52/5 ( download)

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Download or read book Integrated Circuit Quality and Reliability written by Eugene R. Hnatek and published by . This book was released on 1987 with total page 736 pages. Available in PDF, EPUB and Kindle. Book excerpt: Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of contamination; new IC packaging methods; new in-line process monitors and test structures; and more.;This work should be useful to electrical and electronics, quality and reliability, and industrial engineers; computer scientists; integrated circuit manufacturers; and upper-level undergraduate, graduate and continuing-education students in these disciplines.

Author : Behnam Ghavami
Publisher : Springer Nature
ISBN 13 : 3030516105
Total Pages : 114 pages
Book Rating : 4.09/5 ( download)

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Download or read book Soft Error Reliability of VLSI Circuits written by Behnam Ghavami and published by Springer Nature. This book was released on 2020-10-13 with total page 114 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.

Author : Jerome Klion
Publisher : Springer Science & Business Media
ISBN 13 : 9401169705
Total Pages : 616 pages
Book Rating : 4.07/5 ( download)

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Download or read book Practical Electronic Reliability Engineering written by Jerome Klion and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 616 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is intended for the engineer or engineering student with little or no prior background in reliability. Its purpose is to provide the background material and guidance necessary to comprehend and carry out all the tasks associated with a reliability program from specification generation to final demonstration of reliability achieved. Most available texts on reliability concentrate on the mathematics and statistics used for reliability analysis, evaluation, and demonstration. They are more often suited more for the professional with a heavier mathematical background that most engineers have, and more often than not, ignore or pay short-shrift to basic engineering design and organizational efforts associated with a reliability program. A reliability engineer must be familiar with both the mathematics and engineering aspects of a reliability program. This text: 1. Describes the mathematics needed for reliability analysis, evaluation, and demonstration commensurate with an engineer's background. 2. Provides background material, guidance, and references necessary to the structure and implementation of a reliability program including: • identification of the reliability standards in most common use • how to generate and respond to a reliability specification • how reliability can be increased • the tasks which make up a reliability program and how to judge the need and scope of each; how each is commonly performed; caution and comments about their application.

Author : Yusuf Leblebici
Publisher : Springer Science & Business Media
ISBN 13 : 1461532507
Total Pages : 223 pages
Book Rating : 4.07/5 ( download)

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Download or read book Hot-Carrier Reliability of MOS VLSI Circuits written by Yusuf Leblebici and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 223 pages. Available in PDF, EPUB and Kindle. Book excerpt: As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming an important problem. The assessment and improvement of reliability on the circuit level should be based on both the failure mode analysis and the basic understanding of the physical failure mechanisms observed in integrated circuits. Hot-carrier induced degrada tion of MOS transistor characteristics is one of the primary mechanisms affecting the long-term reliability of MOS VLSI circuits. It is likely to become even more important in future generation chips, since the down ward scaling of transistor dimensions without proportional scaling of the operating voltage aggravates this problem. A thorough understanding of the physical mechanisms leading to hot-carrier related degradation of MOS transistors is a prerequisite for accurate circuit reliability evaluation. It is also being recognized that important reliability concerns other than the post-manufacture reliability qualification need to be addressed rigorously early in the design phase. The development and use of accurate reliability simulation tools are therefore crucial for early assessment and improvement of circuit reliability : Once the long-term reliability of the circuit is estimated through simulation, the results can be compared with predetermined reliability specifications or limits. If the predicted reliability does not satisfy the requirements, appropriate design modifications may be carried out to improve the resistance of the devices to degradation.

Author : Eugene R. Hnatek
Publisher : CRC Press
ISBN 13 : 1482277719
Total Pages : 809 pages
Book Rating : 4.15/5 ( download)

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Download or read book Integrated Circuit Quality and Reliability written by Eugene R. Hnatek and published by CRC Press. This book was released on 2018-10-03 with total page 809 pages. Available in PDF, EPUB and Kindle. Book excerpt: Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of contamination; new IC packaging methods; new in-line process monitors and test structures; and more.;This work should be useful to electrical and electronics, quality and reliability, and industrial engineers; computer scientists; integrated circuit manufacturers; and upper-level undergraduate, graduate and continuing-education students in these disciplines.

Author : Norman. B. Fuqua
Publisher : CRC Press
ISBN 13 : 1000103358
Total Pages : 406 pages
Book Rating : 4.59/5 ( download)

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Download or read book Reliability Engineering for Electronic Design written by Norman. B. Fuqua and published by CRC Press. This book was released on 2020-11-26 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book addresses the needs of electronic design engineers, reliability engineers, and their respective managers, stressing a pragmatic viewpoint rather than a vigorous mathematical presentation.

Author : Tim Williams
Publisher : Elsevier
ISBN 13 : 1483102505
Total Pages : 313 pages
Book Rating : 4.04/5 ( download)

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Download or read book The Circuit Designer’s Companion written by Tim Williams and published by Elsevier. This book was released on 2013-10-22 with total page 313 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Circuit Designer’s Companion covers the theoretical aspects and practices in analogue and digital circuit design. Electronic circuit design involves designing a circuit that will fulfill its specified function and designing the same circuit so that every production model of it will fulfill its specified function, and no other undesired and unspecified function. This book is composed of nine chapters and starts with a review of the concept of grounding, wiring, and printed circuits. The subsequent chapters deal with the passive and active components of circuitry design. These topics are followed by discussions of the principles of other design components, including linear integrated circuits, digital circuits, and power supplies. The remaining chapters consider the vital role of electromagnetic compatibility in circuit design. These chapters also look into safety, design of production, testability, reliability, and thermal management of the designed circuit. This book is of great value to electrical and design engineers.

Author : Peter W. Becker
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.86/5 ( download)

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Download or read book Design of Systems and Circuits for Maximum Reliability Or Maximum Production Yield written by Peter W. Becker and published by . This book was released on 1973 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: