Atomic Force Microscopy And Its Applications

Author : Greg Haugstad
Publisher : John Wiley & Sons
ISBN 13 : 0470638826
Total Pages : 496 pages
Book Rating : 4.28/5 ( download)

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Download or read book Atomic Force Microscopy written by Greg Haugstad and published by John Wiley & Sons. This book was released on 2012-09-24 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. “Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com”

Author : Tomasz Tański
Publisher : BoD – Books on Demand
ISBN 13 : 1789851696
Total Pages : 116 pages
Book Rating : 4.94/5 ( download)

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Download or read book Atomic-force Microscopy and Its Applications written by Tomasz Tański and published by BoD – Books on Demand. This book was released on 2019-01-30 with total page 116 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as specialists. This book aims to provide the reader with a comprehensive overview of the new trends, research results and development of atomic force microscopy. The chapters for this book have been written by respected and well-known researchers and specialists from different countries. We hope that after studying this book, you will have objective knowledge about the possible uses of atomic force microscopy in many scientific aspects of our civilisation.

Author : Pier Carlo Braga
Publisher : Springer Science & Business Media
ISBN 13 : 1592596479
Total Pages : 388 pages
Book Rating : 4.78/5 ( download)

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Download or read book Atomic Force Microscopy written by Pier Carlo Braga and published by Springer Science & Business Media. This book was released on 2008-02-02 with total page 388 pages. Available in PDF, EPUB and Kindle. Book excerpt: The natural, biological, medical, and related sciences would not be what they are today without the microscope. After the introduction of the optical microscope, a second breakthrough in morphostructural surface analysis occurred in the 1940s with the development of the scanning electron microscope (SEM), which, instead of light (i. e. , photons) and glass lenses, uses electrons and electromagnetic lenses (magnetic coils). Optical and scanning (or transmission) electron microscopes are called “far-field microscopes” because of the long distance between the sample and the point at which the image is obtained in comparison with the wavelengths of the photons or electrons involved. In this case, the image is a diffraction pattern and its resolution is wavelength limited. In 1986, a completely new type of microscopy was proposed, which, without the use of lenses, photons, or electrons, directly explores the sample surface by means of mechanical scanning, thus opening up unexpected possibilities for the morphostructural and mechanical analysis of biological specimens. These new scanning probe microscopes are based on the concept of near-field microscopy, which overcomes the problem of the limited diffraction-related resolution inherent in conventional microscopes. Located in the immediate vicinity of the sample itself (usually within a few nanometers), the probe records the intensity, rather than the interference signal, thus significantly improving resolution. Since the most we- known microscopes of this type operate using atomic forces, they are frequently referred to as atomic force microscopes (AFMs).

Author : Arturo M. Baró
Publisher : John Wiley & Sons
ISBN 13 : 3527327584
Total Pages : 385 pages
Book Rating : 4.84/5 ( download)

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Download or read book Atomic Force Microscopy in Liquid written by Arturo M. Baró and published by John Wiley & Sons. This book was released on 2012-05-14 with total page 385 pages. Available in PDF, EPUB and Kindle. Book excerpt: About 40 % of current atomic force microscopy (AFM) research is performed in liquids, making liquid-based AFM a rapidly growing and important tool for the study of biological materials. This book focuses on the underlying principles and experimental aspects of AFM under liquid, with an easy-to-follow organization intended for new AFM scientists. The book also serves as an up-to-date review of new AFM techniques developed especially for biological samples. Aimed at physicists, materials scientists, biologists, analytical chemists, and medicinal chemists. An ideal reference book for libraries. From the contents: Part I: General Atomic Force Microscopy * AFM: Basic Concepts * Carbon Nanotube Tips in Atomic Force Microscopy with * Applications to Imaging in Liquid * Force Spectroscopy * Atomic Force Microscopy in Liquid * Fundamentals of AFM Cantilever Dynamics in Liquid * Environments * Single-Molecule Force Spectroscopy * High-Speed AFM for Observing Dynamic Processes in Liquid * Integration of AFM with Optical Microscopy Techniques Part II: Biological Applications * DNA and Protein-DNA Complexes * Single-Molecule Force Microscopy of Cellular Sensors * AFM-Based Single-Cell Force Spectroscopy * Nano-Surgical Manipulation of Living Cells with the AFM

Author : Jiye Cai
Publisher : Springer
ISBN 13 : 9811315108
Total Pages : 235 pages
Book Rating : 4.07/5 ( download)

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Download or read book Atomic Force Microscopy in Molecular and Cell Biology written by Jiye Cai and published by Springer. This book was released on 2018-11-03 with total page 235 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book addresses new achievements in AFM instruments – e.g. higher speed and higher resolution – and how AFM is being combined with other new methods like NSOM, STED, STORM, PALM, and Raman. This book explores the latest advances in atomic force microscopy and related techniques in molecular and cell biology. Atomic force microscopy (AFM) can be used to detect the superstructures of the cell membrane, cell morphology, cell skeletons and their mechanical properties. Opening up new fields of in-situ dynamic study for living cells, enzymatic reactions, fibril growth and biomedical research, these combined techniques will yield valuable new insights into molecule and cell biology. This book offers a valuable resource for students and researchers in the fields of biochemistry, cell research and chemistry etc.

Author : Mario Lanza
Publisher : John Wiley & Sons
ISBN 13 : 3527340912
Total Pages : 382 pages
Book Rating : 4.10/5 ( download)

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Download or read book Conductive Atomic Force Microscopy written by Mario Lanza and published by John Wiley & Sons. This book was released on 2017-12-04 with total page 382 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.

Author : Peter Eaton
Publisher : Oxford University Press
ISBN 13 : 0199570450
Total Pages : 257 pages
Book Rating : 4.54/5 ( download)

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Download or read book Atomic Force Microscopy written by Peter Eaton and published by Oxford University Press. This book was released on 2010-03-25 with total page 257 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.

Author : W. Richard Bowen
Publisher : Butterworth-Heinemann
ISBN 13 : 0080949576
Total Pages : 300 pages
Book Rating : 4.74/5 ( download)

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Download or read book Atomic Force Microscopy in Process Engineering written by W. Richard Bowen and published by Butterworth-Heinemann. This book was released on 2009-06-30 with total page 300 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM. The book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. Fundamentals and techniques are concisely described, while specific benefits for process engineering are clearly defined and illustrated. Key content includes: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the development of fouling resistant membranes; nanoscale pharmaceutical analysis; nanoengineering for cellular sensing; polymers on surfaces; micro and nanoscale rheometry. Atomic force microscopy (AFM) is an important tool for process engineers and scientists as it enables improved processes and products The only book dealing with the theory and practical applications of atomic force microscopy in process engineering Provides best-practice guidance and experience on using AFM for process and product improvement

Author : Ricardo García
Publisher : John Wiley & Sons
ISBN 13 : 352764394X
Total Pages : 212 pages
Book Rating : 4.43/5 ( download)

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Download or read book Amplitude Modulation Atomic Force Microscopy written by Ricardo García and published by John Wiley & Sons. This book was released on 2011-08-24 with total page 212 pages. Available in PDF, EPUB and Kindle. Book excerpt: Filling a gap in the literature, this book features in-depth discussions on amplitude modulation AFM, providing an overview of the theory, instrumental considerations and applications of the technique in both academia and industry. As such, it includes examples from material science, soft condensed matter, molecular biology, and biophysics, among others. The text is written in such a way as to enable readers from different backgrounds and levels of expertise to find the information suitable for their needs.

Author : Gerd Kaupp
Publisher : Springer Science & Business Media
ISBN 13 : 3540284729
Total Pages : 302 pages
Book Rating : 4.27/5 ( download)

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Download or read book Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching written by Gerd Kaupp and published by Springer Science & Business Media. This book was released on 2006-10-24 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.