Applied Scanning Probe Methods IX

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Publisher : Springer Science & Business Media
ISBN 13 : 354074083X
Total Pages : 436 pages
Book Rating : 4.34/5 ( download)

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Book Synopsis Applied Scanning Probe Methods IX by : Bharat Bhushan

Download or read book Applied Scanning Probe Methods IX written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2007-12-20 with total page 436 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely and comprehensive overview of SPM applications.

Applied Scanning Probe Methods VIII

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Publisher : Springer Science & Business Media
ISBN 13 : 3540740805
Total Pages : 512 pages
Book Rating : 4.03/5 ( download)

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Book Synopsis Applied Scanning Probe Methods VIII by : Bharat Bhushan

Download or read book Applied Scanning Probe Methods VIII written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2007-12-20 with total page 512 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

Applied Scanning Probe Methods X

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Publisher : Springer Science & Business Media
ISBN 13 : 3540740856
Total Pages : 475 pages
Book Rating : 4.58/5 ( download)

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Book Synopsis Applied Scanning Probe Methods X by : Bharat Bhushan

Download or read book Applied Scanning Probe Methods X written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2007-12-20 with total page 475 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

Applied Scanning Probe Methods XI

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Publisher : Springer Science & Business Media
ISBN 13 : 3540850376
Total Pages : 281 pages
Book Rating : 4.73/5 ( download)

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Book Synopsis Applied Scanning Probe Methods XI by : Bharat Bhushan

Download or read book Applied Scanning Probe Methods XI written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2008-10-22 with total page 281 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.

Applied Scanning Probe Methods XII

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Publisher : Springer Science & Business Media
ISBN 13 : 3540850392
Total Pages : 271 pages
Book Rating : 4.97/5 ( download)

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Book Synopsis Applied Scanning Probe Methods XII by : Bharat Bhushan

Download or read book Applied Scanning Probe Methods XII written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2008-10-24 with total page 271 pages. Available in PDF, EPUB and Kindle. Book excerpt: Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface deformation processes during straining of a specimen. First steps towards this goal were shown in the 1990s in [1–4] but none of these approaches truly was a microtensile test with sample thicknesses in the range of micrometers. To the authors’ knowledge, this was shown for the rst time by Hild et al. in [5]. 16.

Applied Scanning Probe Methods XIII

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Publisher : Springer Science & Business Media
ISBN 13 : 354085049X
Total Pages : 284 pages
Book Rating : 4.96/5 ( download)

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Book Synopsis Applied Scanning Probe Methods XIII by : Bharat Bhushan

Download or read book Applied Scanning Probe Methods XIII written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2008-10-29 with total page 284 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Applied Scanning Probe Methods X

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Publisher : Springer
ISBN 13 : 9783540740841
Total Pages : 496 pages
Book Rating : 4.48/5 ( download)

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Book Synopsis Applied Scanning Probe Methods X by : Bharat Bhushan

Download or read book Applied Scanning Probe Methods X written by Bharat Bhushan and published by Springer. This book was released on 2008-01-11 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

Applied Scanning Probe Methods VII

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Publisher : Springer Science & Business Media
ISBN 13 : 3540373217
Total Pages : 418 pages
Book Rating : 4.16/5 ( download)

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Book Synopsis Applied Scanning Probe Methods VII by : Bharat Bhushan

Download or read book Applied Scanning Probe Methods VII written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2006-11-09 with total page 418 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every 12 to 18 months to capture latest developments. Volume VII presents 9 chapters on a variety of new and emerging techniques and refinements of SPM applications.

Applied Scanning Probe Methods VI

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Publisher : Springer
ISBN 13 : 9783540373186
Total Pages : 338 pages
Book Rating : 4.87/5 ( download)

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Book Synopsis Applied Scanning Probe Methods VI by : Bharat Bhushan

Download or read book Applied Scanning Probe Methods VI written by Bharat Bhushan and published by Springer. This book was released on 2006-10-18 with total page 338 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every 12 to 18 months to capture latest developments. Volume VI presents 10 chapters on a variety of new and emerging techniques and refinements of SPM applications.

Nanotribology and Nanomechanics II

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Publisher : Springer Science & Business Media
ISBN 13 : 3642152635
Total Pages : 1025 pages
Book Rating : 4.34/5 ( download)

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Book Synopsis Nanotribology and Nanomechanics II by : Bharat Bhushan

Download or read book Nanotribology and Nanomechanics II written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2011-05-30 with total page 1025 pages. Available in PDF, EPUB and Kindle. Book excerpt: The comprehensive reference and textbook serves as a timely, practical introduction to the principles of nanotribology and nanomechanics. Assuming some familiarity with macroscopic tribology, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. They cover key measurement techniques, their applications, and theoretical modelling of interfaces, each beginning their contributions with macro- and progressing to microconcepts.