Analytical Techniques For Semiconductor Materials And Process Characterization 6 Altech 2009

Author : Bernd O. Kolbesen
Publisher : The Electrochemical Society
ISBN 13 : 1566777402
Total Pages : 479 pages
Book Rating : 4.07/5 ( download)

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Download or read book Analytical Techniques for Semiconductor Materials and Process Characterization 6 (ALTECH 2009) written by Bernd O. Kolbesen and published by The Electrochemical Society. This book was released on 2009-09 with total page 479 pages. Available in PDF, EPUB and Kindle. Book excerpt: The proceedings of ALTECH 2009 address recent developments and applications of analytical techniques for semiconductor materials, processes and devices. The papers comprise techniques of elemental and structural analysis for bulk and surface impurities and defects, thin films as well as dopants in ultra-shallow junctions.

Author : Bernd O. Kolbesen
Publisher :
ISBN 13 : 9781607680901
Total Pages : 465 pages
Book Rating : 4.04/5 ( download)

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Download or read book Analytical Techniques for Semiconductor Materials and Process Characterization 6 written by Bernd O. Kolbesen and published by . This book was released on 2009 with total page 465 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author : Bernd O. Kolbesen
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.45/5 ( download)

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Download or read book Analytical Techniques for Semiconductor Materials and Process Characterization written by Bernd O. Kolbesen and published by . This book was released on 1990 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author : Bernd O. Kolbesen
Publisher : The Electrochemical Society
ISBN 13 : 9781566773485
Total Pages : 572 pages
Book Rating : 4.82/5 ( download)

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Download or read book Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes written by Bernd O. Kolbesen and published by The Electrochemical Society. This book was released on 2003 with total page 572 pages. Available in PDF, EPUB and Kindle. Book excerpt: .".. ALTECH 2003 was Symposium J1 held at the 203rd Meeting of the Electrochemical Society in Paris, France from April 27 to May 2, 2003 ... Symposium M1, Diagnostic Techniques for Semiconductor Materials and Devices, was part of the 202nd Meeting of the Electrochemical Society held in Salt Lake City, Utah, from October 21 to 25, 2002 ..."--p. iii.

Author : Electrochemical Society (Ecs)
Publisher : Curran Associates Incorporated
ISBN 13 : 9781604238259
Total Pages : 161 pages
Book Rating : 4.59/5 ( download)

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Download or read book Analytical Techniques for Semiconductor Materials and Process Characterization 5 written by Electrochemical Society (Ecs) and published by Curran Associates Incorporated. This book was released on 2007 with total page 161 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author : Dieter K. Schroder
Publisher : The Electrochemical Society
ISBN 13 : 1566775698
Total Pages : 406 pages
Book Rating : 4.94/5 ( download)

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Download or read book Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes 7 written by Dieter K. Schroder and published by The Electrochemical Society. This book was released on 2007 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt: Diagnostic characterization techniques for semiconductor materials, devices and device processing are addressed at this symposium. It will cover new techniques as well as advances in routine analytical technology applied to semiconductor process development and manufacture. The hardcover edition includes a CD-ROM of ECS Transactions, Volume 10, Issue 1, Analytical Techniques for Semiconductor Materials and Process Characterization 5 (ALTECH 2007). The PDF edition also includes the ALTECH 2007 papers.

Author : Bernd O. Kolbesen
Publisher : The Electrochemical Society
ISBN 13 : 9781566771221
Total Pages : 380 pages
Book Rating : 4.26/5 ( download)

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Download or read book ALTECH 95 written by Bernd O. Kolbesen and published by The Electrochemical Society. This book was released on 1995 with total page 380 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author : Bernd O. Kolbesen (Chemiker.)
Publisher : The Electrochemical Society
ISBN 13 : 9781566772396
Total Pages : 568 pages
Book Rating : 4.97/5 ( download)

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Download or read book Analytical and Diagnostic Techniques for Semiconductor Materials, Devices and Processes written by Bernd O. Kolbesen (Chemiker.) and published by The Electrochemical Society. This book was released on 1999 with total page 568 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author :
Publisher :
ISBN 13 :
Total Pages : 1020 pages
Book Rating : 4.99/5 ( download)

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Download or read book Journal of the Electrochemical Society written by and published by . This book was released on 2009 with total page 1020 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Author : Sarah B. Boyd
Publisher : Springer Science & Business Media
ISBN 13 : 1441999884
Total Pages : 243 pages
Book Rating : 4.87/5 ( download)

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Download or read book Life-Cycle Assessment of Semiconductors written by Sarah B. Boyd and published by Springer Science & Business Media. This book was released on 2011-10-12 with total page 243 pages. Available in PDF, EPUB and Kindle. Book excerpt: Life-Cycle Assessment of Semiconductors presents the first and thus far only available transparent and complete life cycle assessment of semiconductor devices. A lack of reliable semiconductor LCA data has been a major challenge to evaluation of the potential environmental benefits of information technologies (IT). The analysis and results presented in this book will allow a higher degree of confidence and certainty in decisions concerning the use of IT in efforts to reduce climate change and other environmental effects. Coverage includes but is not limited to semiconductor manufacturing trends by product type and geography, unique coverage of life-cycle assessment, with a focus on uncertainty and sensitivity analysis of energy and global warming missions for CMOS logic devices, life cycle assessment of flash memory and life cycle assessment of DRAM. The information and conclusions discussed here will be highly relevant and useful to individuals and institutions.