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Author : Bernd O. Kolbesen
Publisher : The Electrochemical Society
ISBN 13 : 9781566771221
Total Pages : 380 pages
Book Rating : 4.26/5 ( download)
Download or read book ALTECH 95 written by Bernd O. Kolbesen and published by The Electrochemical Society. This book was released on 1995 with total page 380 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Robert Hull
Publisher : IET
ISBN 13 : 9780852969335
Total Pages : 1054 pages
Book Rating : 4.33/5 ( download)
Download or read book Properties of Crystalline Silicon written by Robert Hull and published by IET. This book was released on 1999 with total page 1054 pages. Available in PDF, EPUB and Kindle. Book excerpt: A unique and well-organized reference, this book provides illuminating data, distinctive insight and expert guidance on silicon properties.
Author :
Publisher :
ISBN 13 :
Total Pages : 378 pages
Book Rating : 4.55/5 ( download)
Download or read book Code of Federal Regulations written by and published by . This book was released on 1995 with total page 378 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Bernd O. Kolbesen (Chemiker.)
Publisher :
ISBN 13 :
Total Pages : 536 pages
Book Rating : 4.73/5 ( download)
Download or read book Proceedings of the Symposium on Crystalline Defects and Contamination, Their Impact and Control in Device Manufacturing II written by Bernd O. Kolbesen (Chemiker.) and published by . This book was released on 1997 with total page 536 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Richard E. Novak
Publisher : The Electrochemical Society
ISBN 13 : 9781566771153
Total Pages : 642 pages
Book Rating : 4.53/5 ( download)
Download or read book Proceedings of the Fourth International Symposium on Cleaning Technology in Semiconductor Device Manufacturing written by Richard E. Novak and published by The Electrochemical Society. This book was released on 1996 with total page 642 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Madhav Datta
Publisher : The Electrochemical Society
ISBN 13 : 9781566771719
Total Pages : 312 pages
Book Rating : 4.14/5 ( download)
Download or read book Proceedings of the Symposium on Environmental Aspects of Electrochemical Technology: Applications in Electronics written by Madhav Datta and published by The Electrochemical Society. This book was released on 1997 with total page 312 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : P. Rai-Choudhury
Publisher : The Electrochemical Society
ISBN 13 : 9781566771399
Total Pages : 496 pages
Book Rating : 4.90/5 ( download)
Download or read book Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices written by P. Rai-Choudhury and published by The Electrochemical Society. This book was released on 1997 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Peter L. F. Hemment
Publisher : The Electrochemical Society
ISBN 13 : 9781566771535
Total Pages : 458 pages
Book Rating : 4.36/5 ( download)
Download or read book Proceedings of the Seventh International Symposium on Silicon-on-Insulator Technology and Devices written by Peter L. F. Hemment and published by The Electrochemical Society. This book was released on 1996 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : J. Doneker
Publisher : Routledge
ISBN 13 : 1351456474
Total Pages : 524 pages
Book Rating : 4.70/5 ( download)
Download or read book Defect Recognition and Image Processing in Semiconductors 1997 written by J. Doneker and published by Routledge. This book was released on 2017-11-22 with total page 524 pages. Available in PDF, EPUB and Kindle. Book excerpt: Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.
Author : Dinesh C. Gupta
Publisher : ASTM International
ISBN 13 : 0803124899
Total Pages : 389 pages
Book Rating : 4.99/5 ( download)
Download or read book Recombination Lifetime Measurements in Silicon written by Dinesh C. Gupta and published by ASTM International. This book was released on 1998 with total page 389 pages. Available in PDF, EPUB and Kindle. Book excerpt:
